|
1. |
Editorial |
|
International Journal of Microwave and Millimeter‐Wave Computer‐Aided Engineering,
Volume 1,
Issue 3,
1991,
Page 251-252
K. C. Gupta,
Preview
|
PDF (187KB)
|
|
ISSN:1050-1827
DOI:10.1002/mmce.4570010302
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
|
2. |
The relationship between bivariate volterra analysis and power series analysis with application to the behavioral modeling of microwave circuits |
|
International Journal of Microwave and Millimeter‐Wave Computer‐Aided Engineering,
Volume 1,
Issue 3,
1991,
Page 253-262
Philip J. Lunsford,
Michael B. Steer,
Preview
|
PDF (636KB)
|
|
摘要:
AbstractVolterra nonlinear transfer functions can be used in the behavioral modeling of many nonlinear microwave circuits. They can be developed experimentally, numerically, and, to a limited extent, analytically. This article presents an enhanced analytic method for developing bivariate Volterra nonlinear transfer functions based on their relationship to power series. The technique is applied to the Volterra‐series‐based behavioral modeling of a MESFET amplifier using experimental characterization of the MES
ISSN:1050-1827
DOI:10.1002/mmce.4570010303
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
|
3. |
Statistical analysis of GaAs MESFET S‐parameter equivalent‐circuit models |
|
International Journal of Microwave and Millimeter‐Wave Computer‐Aided Engineering,
Volume 1,
Issue 3,
1991,
Page 263-270
R. Anholt,
R. Worley,
R. Neidhard,
Preview
|
PDF (592KB)
|
|
摘要:
AbstractWe compare the ability of three different equivalent‐circuit extraction methods to give ensembles of model parameters that accurately predict not only average S‐parameters but the S‐parameter statistics, i.e., the standard deviations and intercorrelations between the real and imaginary parts. Measurements were made for 400 GaAs MESFETs fabricated on a single wafer with an MBE‐grown active layer. Data is compared for different biases. We find that bimodal distributions give correlations that the equivalent‐circuit models fail to model. The possibility of using uncorrelated equivalent‐circuit values is als
ISSN:1050-1827
DOI:10.1002/mmce.4570010304
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
|
4. |
Relationship between process and materials variations and variations in S‐ and equivalent‐circuit parameters |
|
International Journal of Microwave and Millimeter‐Wave Computer‐Aided Engineering,
Volume 1,
Issue 3,
1991,
Page 271-281
R. Anholt,
J. King,
R. Worley,
J. Gillespie,
Preview
|
PDF (996KB)
|
|
摘要:
AbstractUsing a variety of DC and RF measurements of electrical parameters of GaAs MESFETs and the GATES process and device modeling program, we derive distributions of the root process variations. These distributions are then used in GATES Monte Carlo simulations to compute distributions of equivalent‐circuit parameters and S‐parameters at a fixed frequency (6 GHz). We find reasonable agreement between the simulated variations and the standard deviations in the measured S‐parameters, enabling us to determine the most important process variations affecting S‐parameter uni
ISSN:1050-1827
DOI:10.1002/mmce.4570010305
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
|
5. |
A de‐embedding algorithm for electromagnetics |
|
International Journal of Microwave and Millimeter‐Wave Computer‐Aided Engineering,
Volume 1,
Issue 3,
1991,
Page 282-287
James C. Rautio,
Preview
|
PDF (503KB)
|
|
摘要:
AbstractA “double delay” de‐embedding algorithm appropriate for electromagnetic analyses is described. This algorithm uses only two standards, a through and a double length through. By evaluating these standards, a special class of port discontinuities may be characterized and removed from the data calculated for a complete structure. Unlike related physical de‐embedding algorithms, both the characteristic impedance and the velocity of propagation of the through lines are determined. The technique described here is difficult to implement in a physical de‐embedding. The de‐embedding theory also provides a new definition of characteristic impedance, “equivalent TEM impedance,” for inhomogeneous media, such as microstrip. This new impedance exhibits a nonmonotonic dispersion which has been measured experimentally but is not seen using previous impeda
ISSN:1050-1827
DOI:10.1002/mmce.4570010306
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
|
6. |
The computer‐aided design of microwave matching networks |
|
International Journal of Microwave and Millimeter‐Wave Computer‐Aided Engineering,
Volume 1,
Issue 3,
1991,
Page 288-305
Stephen E. Sussman‐Fort,
Preview
|
PDF (1418KB)
|
|
摘要:
AbstractMatching networks, as used between the consecutive stages of an amplifier to manage the transfer of power between the complex source impedance, the active devices, and the load, continue to be of importance, particularly in microwave systems. Synthesis techniques for these networks have evolved from the classical theory to novel numerical approaches that yield significant practical advantages. We review here several well‐known design methods, including the classical derivation, sloped‐approximation synthesis, and the real‐frequency technique. Also considered are enhancements and variations of these methods. Furthermore, we describe the iterated analysis approach, which appears to provide the greatest design flexibility, efficiency, and accuracy to date. Examples are given which illustrate the relative merits of some of the more modern computer‐assisted techniques. Finally, we discuss ideas for further research in the area of matching network sy
ISSN:1050-1827
DOI:10.1002/mmce.4570010307
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
|
7. |
Synthesis of equivalent circuits for inductive strips in homogeneous finline:W/b= 1 |
|
International Journal of Microwave and Millimeter‐Wave Computer‐Aided Engineering,
Volume 1,
Issue 3,
1991,
Page 306-314
Jeffrey B. Knorr,
Preview
|
PDF (526KB)
|
|
摘要:
AbstractThis article describes a procedure for synthesizing equivalent circuits for inductive strips in homogeneous finline withW/b= 1. Values of strip scattering coefficients predicted by the circuit model are shown to be in excellent agreement with the scattering coefficients predicted by a spectral domain electromagnetic model.
ISSN:1050-1827
DOI:10.1002/mmce.4570010308
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
|
8. |
MIC simulation column |
|
International Journal of Microwave and Millimeter‐Wave Computer‐Aided Engineering,
Volume 1,
Issue 3,
1991,
Page 315-325
Preview
|
PDF (399KB)
|
|
ISSN:1050-1827
DOI:10.1002/mmce.4570010309
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
|
9. |
Erratum |
|
International Journal of Microwave and Millimeter‐Wave Computer‐Aided Engineering,
Volume 1,
Issue 3,
1991,
Page 327-327
Preview
|
PDF (21KB)
|
|
ISSN:1050-1827
DOI:10.1002/mmce.4570010310
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
|
10. |
Call for papers |
|
International Journal of Microwave and Millimeter‐Wave Computer‐Aided Engineering,
Volume 1,
Issue 3,
1991,
Page 329-329
Preview
|
PDF (67KB)
|
|
ISSN:1050-1827
DOI:10.1002/mmce.4570010311
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1991
数据来源: WILEY
|
|