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11. |
High‐resolution triple‐crystal X‐ray diffraction experiments performed at the Australian National Beamline Facility on a silicon sample with lateral periodic superstructure |
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Journal of Applied Crystallography,
Volume 28,
Issue 1,
1995,
Page 57-60
A. Yu. Nikulin,
A. W. Stevenson,
H. Hashizume,
S. W. Wilkins,
D. Cookson,
G. Foran,
R. F. Garrett,
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摘要:
The synchrotron X‐ray results reported here are from the first high‐resolution triple‐crystal diffraction experiments performed at the Australian National Beamline Facility (ANBF). At the centre of the ANBF is a multipurpose high‐resolution two‐axis vacuum X‐ray diffractometer. The Si(111) sample studied has been implanted with B+ions through a one‐dimensional SiO2strip pattern with a 5.83 μm period and 4 μm open region, to produce a sample with a periodic superstructure in the lateral direction. The triple‐crystal data were collected in the form of two‐dimensional intensity maps in the vicinity of the 111 Bragg peak. Results collected in both air and vacuum are compared, as are results with and without the oxide layer. The data collected in vacuum indicate that it is possible at the ANBF to measure lattice distortions perpendicular to the sample surface with
ISSN:1600-5767
DOI:10.1107/S0021889894010101
出版商:International Union of Crystallography
年代:1995
数据来源: WILEY
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12. |
A possible new route to precise lattice‐parameter measurement of perfect crystals using the divergent‐X‐ray beam method |
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Journal of Applied Crystallography,
Volume 28,
Issue 1,
1995,
Page 61-64
A. R. Lang,
G. Pang,
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摘要:
Newly observed diffraction phenomena that appear in the transmitted divergent‐beam (pseudo‐Kossel) patterns given by perfect or nearly perfect crystals are reported. They are seen within the areas of overlapping intensity distributions where two or more Kossel lines cross. The pseudo‐Kossel patterns were generated using a scanning electron microscope to produce a small X‐ray source (diameter<10 μm) within a 2 μm‐thick copper film coating single surfaces of polished, plate‐shaped, nearly perfect diamond specimens. Experimental conditions determined that the observed width of Kossel lines was dominated by CuKα1wavelength spread. Imposed upon the overall area of crossing of these dispersion‐broadened lines, there appear fine streaks of enhanced transmitted intensity that delineate loci along which, as the wavelength changes,coherentmultiple diffraction occurs, accompanied by enhanced Borrmann transmission. These fine‐scale features, only a few arcseconds in angular width, add markers to the broad‐line Kossel pattern that should be exploitable in lattic
ISSN:1600-5767
DOI:10.1107/S0021889894011118
出版商:International Union of Crystallography
年代:1995
数据来源: WILEY
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13. |
SORTX‐ a program for on‐screen stick‐model editing and autosorting ofSHELXfiles for use on a PC |
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Journal of Applied Crystallography,
Volume 28,
Issue 1,
1995,
Page 65-65
P. McArdle,
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ISSN:1600-5767
DOI:10.1107/S0021889894010642
出版商:International Union of Crystallography
年代:1995
数据来源: WILEY
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14. |
Nominations for the Ewald Prize |
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Journal of Applied Crystallography,
Volume 28,
Issue 1,
1995,
Page 66-67
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PDF (304KB)
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ISSN:1600-5767
DOI:10.1107/S0021889894014226
出版商:International Union of Crystallography
年代:1995
数据来源: WILEY
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15. |
New Commercial Products |
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Journal of Applied Crystallography,
Volume 28,
Issue 1,
1995,
Page 67-68
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PDF (210KB)
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ISSN:1600-5767
DOI:10.1107/S0021889895099675
出版商:International Union of Crystallography
年代:1995
数据来源: WILEY
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16. |
Random, non‐random and periodic faulting in crystalsby M. T. Sebastian and P. Krishna |
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Journal of Applied Crystallography,
Volume 28,
Issue 1,
1995,
Page 68-68
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PDF (66KB)
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ISSN:1600-5767
DOI:10.1107/S0021889895099638
出版商:International Union of Crystallography
年代:1995
数据来源: WILEY
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