Journal of Applied Crystallography


ISSN: 1600-5767        年代:1995
当前卷期:Volume 28  issue 1     [ 查看所有卷期 ]

年代:1995
 
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11. High‐resolution triple‐crystal X‐ray diffraction experiments performed at the Australian National Beamline Facility on a silicon sample with lateral periodic superstructure
  Journal of Applied Crystallography,   Volume  28,   Issue  1,   1995,   Page  57-60

A. Yu. Nikulin,   A. W. Stevenson,   H. Hashizume,   S. W. Wilkins,   D. Cookson,   G. Foran,   R. F. Garrett,  

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12. A possible new route to precise lattice‐parameter measurement of perfect crystals using the divergent‐X‐ray beam method
  Journal of Applied Crystallography,   Volume  28,   Issue  1,   1995,   Page  61-64

A. R. Lang,   G. Pang,  

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13. SORTX‐ a program for on‐screen stick‐model editing and autosorting ofSHELXfiles for use on a PC
  Journal of Applied Crystallography,   Volume  28,   Issue  1,   1995,   Page  65-65

P. McArdle,  

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14. Nominations for the Ewald Prize
  Journal of Applied Crystallography,   Volume  28,   Issue  1,   1995,   Page  66-67

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15. New Commercial Products
  Journal of Applied Crystallography,   Volume  28,   Issue  1,   1995,   Page  67-68

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16. Random, non‐random and periodic faulting in crystalsby M. T. Sebastian and P. Krishna
  Journal of Applied Crystallography,   Volume  28,   Issue  1,   1995,   Page  68-68

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