11. |
Electron‐induced decomposition of Tin(IV) sulphide in the electron microscope |
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Journal of Applied Crystallography,
Volume 8,
Issue 1,
1975,
Page 49-53
G. J. Tatlock,
M. White,
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摘要:
A combination of selected‐area electron diffraction and the new technique of `real‐space crystallography' has been used to monitor the electron‐induced decomposition of tin (IV) sulfide. In contradiction to the results of other workers, the final product of the decomposition was found to be SnS, while at an intermediate stage, platelets of SnS were formed with (010)SnSparallel to (001
ISSN:1600-5767
DOI:10.1107/S002188987500951X
出版商:International Union of Crystallography
年代:1975
数据来源: WILEY
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12. |
PERNOD‐ Ein Programm zur Verfeinerung von Kristallstrukturparametern aus Neutronenbeugungspulverdiagrammen |
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Journal of Applied Crystallography,
Volume 8,
Issue 1,
1975,
Page 54-59
S. Klein,
H. Weitzel,
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摘要:
The programPERNODdescribed in this paper serves to refine crystal structure parameters from neutron powder diffraction data. The observed powder diagram is subdivided into groups of reflexions. The chosen boundaries of these groups are corrected by the program to obtain the best fit between a calculated line profile and the observed diagram. The observed intensities of reflexion groups obtained in this way are then split up into `observed' intensities of single reflexions using preliminary calculated reflexion intensities. The atomic parameters are refined using theORFLSprogram, where the lattice constants are refined with the help of the line profile itself. As an example the atomic parameters of wolframite CuWO4are refined.
ISSN:1600-5767
DOI:10.1107/S0021889875009521
出版商:International Union of Crystallography
年代:1975
数据来源: WILEY
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13. |
The measurement of integrated intensities from polymeric‐fibre X‐ray diffraction photographs |
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Journal of Applied Crystallography,
Volume 8,
Issue 1,
1975,
Page 60-64
I. H. Hall,
M. G. Pass,
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摘要:
A method is described whereby integrated intensities can be obtained from X‐ray diffraction photographs of polymeric fibres. Contour maps of optical density are produced using a digital microdensitometer and `Photowrite' manufactured by Optronics International, Inc., and the total intensity obtained by integrating round contour lines. The method takes less time than making radial scans through the peak intensity of each reflection arc with a scanning microdensitometer, and correcting for the spread in the circumferential directio
ISSN:1600-5767
DOI:10.1107/S0021889875009533
出版商:International Union of Crystallography
年代:1975
数据来源: WILEY
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14. |
Lattice parameter of the non‐stoichiometric compound TiNx |
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Journal of Applied Crystallography,
Volume 8,
Issue 1,
1975,
Page 65-66
S. Nagakura,
T. Kusunoki,
F. Kakimoto,
Y. Hirotsu,
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摘要:
Contamination‐free TiNxwas prepared and the lattice parameter (a0)–nitrogen content (x) relation determined. The result can be expressed asa0= 4.1925 + 0.0467x(in Å) in the range 0.605 ≤x≤ 0.999. Density measurement showed that no titanium vacancies existed in the
ISSN:1600-5767
DOI:10.1107/S0021889875009545
出版商:International Union of Crystallography
年代:1975
数据来源: WILEY
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15. |
The variances of the CuKβ and FeKβ spectral distributions |
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Journal of Applied Crystallography,
Volume 8,
Issue 1,
1975,
Page 66-66
J. I. Langford,
J. Tapia,
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摘要:
The β lines ofKradiation can be used to advantage in some line‐broadening measurements if allowance is made for the complexity of the β spectrum. The use of β lines in the variance method for studying diffraction broadening is discussed, with particular reference to CuKβ and FeKβ rad
ISSN:1600-5767
DOI:10.1107/S0021889875009557
出版商:International Union of Crystallography
年代:1975
数据来源: WILEY
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16. |
Computer simulation of X‐ray topographs of stacking faults in silicon |
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Journal of Applied Crystallography,
Volume 8,
Issue 1,
1975,
Page 67-68
B. C. Wonsiewicz,
J. R. Patel,
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摘要:
This note reports on high‐picture‐quality computer‐simulation investigation of X‐ray topographs of stacking faults in silicon. The dynamical theory of X‐ray diffraction including absorption has been used to generate detailed intensity information on section and traverse topographs of a perfect crystal containing an extrinsic stacking fault. An important advantage of the simulation technique is that it permits detailed comparison of the various features of the topographs with e
ISSN:1600-5767
DOI:10.1107/S0021889875009569
出版商:International Union of Crystallography
年代:1975
数据来源: WILEY
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17. |
Crystal data for C.I. pigment Red 6, 4‐chloro‐2‐nitrophenylazo‐2‐naphthol |
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Journal of Applied Crystallography,
Volume 8,
Issue 1,
1975,
Page 69-70
A. Whitaker,
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摘要:
The preliminary single‐crystal data and powder pattern are given for C. I. Pigment Red 6. The powder pattern has been indexed using the single‐crystal dimensions; the problems of multiple indexing have been reduced by comparison with single‐crystal intens
ISSN:1600-5767
DOI:10.1107/S0021889875009570
出版商:International Union of Crystallography
年代:1975
数据来源: WILEY
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18. |
Crystal data for Mn5Si2 |
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Journal of Applied Crystallography,
Volume 8,
Issue 1,
1975,
Page 70-73
J. P. Sénateur,
R. Fruchart,
C. B. Shoemaker,
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摘要:
The cell dimensions of Mn5Si2have been refined by least squares with the powder diffraction data of J. P. Sénateur (Thèse Doct. Sci. phys. Paris, 1967). Mn5Si2is isotypic with theDphase (V26.5Fe44Si29.5), and is tetragonal,a= 8.9097 ± 2,c= 8.7153 ± 3 Å, 56 atoms per unit cell, space groupP41212. The observed powder diffraction intensities are compared with those calculated for the refined crystal structure (C. B. Shoemaker&D. P. Shoemaker,Acta Cryst. to be publ
ISSN:1600-5767
DOI:10.1107/S0021889875009582
出版商:International Union of Crystallography
年代:1975
数据来源: WILEY
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19. |
A general computer program for the analysis of X‐ray diffraction data for liquids |
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Journal of Applied Crystallography,
Volume 8,
Issue 1,
1975,
Page 73-75
G. Licheri,
G. Piccaluga,
G. Pinna,
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摘要:
A general computer program for the analysis of X‐ray diffraction data for liquids is here described. It consists of a central part (main) and a number of subroutines, in which one single step of the elaboration of experimental intensities is performed. This arrangement allows the entire sequence of operations to be performed as far as the radial distribution functions; alternatively only a part can be performed, starting or stopping at any point. The program is flexible and easily modifiable for the user's need
ISSN:1600-5767
DOI:10.1107/S0021889875009594
出版商:International Union of Crystallography
年代:1975
数据来源: WILEY
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20. |
Crystallographers |
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Journal of Applied Crystallography,
Volume 8,
Issue 1,
1975,
Page 75-75
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ISSN:1600-5767
DOI:10.1107/S0021889875009612
出版商:International Union of Crystallography
年代:1975
数据来源: WILEY
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