Journal of Applied Crystallography


ISSN: 1600-5767        年代:1993
当前卷期:Volume 26  issue 1     [ 查看所有卷期 ]

年代:1993
 
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21. Microabsorption of scattered X‐rays and its dependence on incidence angle in the nonsymmetric reflection case
  Journal of Applied Crystallography,   Volume  26,   Issue  1,   1993,   Page  132-134

W. Pitschke,   H. Hermann,   N. Mattern,  

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22. Cryostat for synchrotron powder diffraction with sample rotation and controlled gas atmosphere in the sample chamber
  Journal of Applied Crystallography,   Volume  26,   Issue  1,   1993,   Page  135-137

J. Ihringer,   A. Küster,  

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23. POLISH: computer program for improving the accuracy of structure‐factor magnitudes obtained from powder data
  Journal of Applied Crystallography,   Volume  26,   Issue  1,   1993,   Page  137-139

P. G. Byrom,   B. W. Lucas,  

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24. DIFK91: a program for the modelling of powder diffraction patterns on a PC
  Journal of Applied Crystallography,   Volume  26,   Issue  1,   1993,   Page  140-141

Ľ. Smrčok,   Z. Weiss,  

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25. Hazards of oblique coordinate systems: a reminder
  Journal of Applied Crystallography,   Volume  26,   Issue  1,   1993,   Page  142-143

K. W. Muir,   P. R. Mallinson,  

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26. XTALLABandPOWDER– computer assisted instruction in elementary crystallographic methods
  Journal of Applied Crystallography,   Volume  26,   Issue  1,   1993,   Page  144-144

C. L. Day,   R. A. Jacobson,  

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27. Stuctural and chemical analysis of materials. X‐ray,electron,and neutron diffraction;X‐ray,electron,and ion spectrometry;electron microscopyby J. P. Eberhart
  Journal of Applied Crystallography,   Volume  26,   Issue  1,   1993,   Page  145-146

N. W. Thomas,  

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28. Journal of Applied Crystallography. Notes for Authors
  Journal of Applied Crystallography,   Volume  26,   Issue  1,   1993,   Page  146-150

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