21. |
Microabsorption of scattered X‐rays and its dependence on incidence angle in the nonsymmetric reflection case |
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Journal of Applied Crystallography,
Volume 26,
Issue 1,
1993,
Page 132-134
W. Pitschke,
H. Hermann,
N. Mattern,
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摘要:
The microabsorption of X‐rays scattered by isotropic powder samples is studied for nonsymmetric beam geometry including grazing incidence. Experimental results for the absorption effect and its dependence on both the incidence and scattering angles are presented. The absorption behaviour is qualitatively explained by means of a simple surface‐roughness mo
ISSN:1600-5767
DOI:10.1107/S0021889892009257
出版商:International Union of Crystallography
年代:1993
数据来源: WILEY
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22. |
Cryostat for synchrotron powder diffraction with sample rotation and controlled gas atmosphere in the sample chamber |
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Journal of Applied Crystallography,
Volume 26,
Issue 1,
1993,
Page 135-137
J. Ihringer,
A. Küster,
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摘要:
The cryostat for 8
ISSN:1600-5767
DOI:10.1107/S0021889892009269
出版商:International Union of Crystallography
年代:1993
数据来源: WILEY
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23. |
POLISH: computer program for improving the accuracy of structure‐factor magnitudes obtained from powder data |
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Journal of Applied Crystallography,
Volume 26,
Issue 1,
1993,
Page 137-139
P. G. Byrom,
B. W. Lucas,
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摘要:
A computer program,POLISH, is presented that improves the accuracy of the structure‐factor magnitudes obtained from powder data. This offers a greater likelihood of success for structure determination by direct methods or Patterson techniques. Generally, the program will be used in conjunction with a unit‐cell refinement program, but it may also be used independently. Accurate values of the unit‐cell and peak‐shape parameters are required, which may be conveniently obtained from the unit‐cell‐refinement program. The program is tested by application t
ISSN:1600-5767
DOI:10.1107/S0021889892007611
出版商:International Union of Crystallography
年代:1993
数据来源: WILEY
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24. |
DIFK91: a program for the modelling of powder diffraction patterns on a PC |
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Journal of Applied Crystallography,
Volume 26,
Issue 1,
1993,
Page 140-141
Ľ. Smrčok,
Z. Weiss,
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摘要:
A new version of the programDIFK[Weiss, Krajíček, Smrčok&Fiala (1983).J. Appl. Cryst.16, 493–497] has been developed for use on an IBM‐compatible personal computer (PC). The main strengths of the program are (i) calculation of the diffraction patterns of mixtures of up to five phases, (ii) searching for real maxima resulting from the coincidence of several diffractions, (iii) modelling the influence of preferred orientation and (iv) the performance of these calculations for different diffraction geometries. Besides a standard printout the program also produces files in the HPGL
ISSN:1600-5767
DOI:10.1107/S0021889892008070
出版商:International Union of Crystallography
年代:1993
数据来源: WILEY
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25. |
Hazards of oblique coordinate systems: a reminder |
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Journal of Applied Crystallography,
Volume 26,
Issue 1,
1993,
Page 142-143
K. W. Muir,
P. R. Mallinson,
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摘要:
A reminder is given that ignoring correlations between fractional coordinates in an oblique coordinate system can lead to inaccuracies in the estimation of standard deviations of bond lengths and other derived quantities. Methods based on a paper by Templeton [Acta Cryst.(1959),12, 771–773] are suggested to make approximate allowance for the effect when the parameter variance matrix is unavailabl
ISSN:1600-5767
DOI:10.1107/S0021889892011774
出版商:International Union of Crystallography
年代:1993
数据来源: WILEY
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26. |
XTALLABandPOWDER– computer assisted instruction in elementary crystallographic methods |
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Journal of Applied Crystallography,
Volume 26,
Issue 1,
1993,
Page 144-144
C. L. Day,
R. A. Jacobson,
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ISSN:1600-5767
DOI:10.1107/S0021889892007751
出版商:International Union of Crystallography
年代:1993
数据来源: WILEY
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27. |
Stuctural and chemical analysis of materials. X‐ray,electron,and neutron diffraction;X‐ray,electron,and ion spectrometry;electron microscopyby J. P. Eberhart |
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Journal of Applied Crystallography,
Volume 26,
Issue 1,
1993,
Page 145-146
N. W. Thomas,
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ISSN:1600-5767
DOI:10.1107/S0021889892008355
出版商:International Union of Crystallography
年代:1993
数据来源: WILEY
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28. |
Journal of Applied Crystallography. Notes for Authors |
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Journal of Applied Crystallography,
Volume 26,
Issue 1,
1993,
Page 146-150
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ISSN:1600-5767
DOI:10.1107/S0021889893099650
出版商:International Union of Crystallography
年代:1993
数据来源: WILEY
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