Journal of Applied Crystallography


ISSN: 1600-5767        年代:1975
当前卷期:Volume 8  issue 4     [ 查看所有卷期 ]

年代:1975
 
     Volume 8  issue 1   
     Volume 8  issue 2   
     Volume 8  issue 3   
     Volume 8  issue 4
     Volume 8  issue 5   
     Volume 8  issue 6   
1. Liquid‐structure analysis by energy‐scanning X‐ray diffraction: mercury
  Journal of Applied Crystallography,   Volume  8,   Issue  4,   1975,   Page  405-414

J. M. Prober,   J. M. Schultz,  

Preview   |   PDF (1094KB)

2. Lattice‐resolution electron microscopy in structural studies of non‐graphitizing carbons from polyvinylidene chloride (PVDC)
  Journal of Applied Crystallography,   Volume  8,   Issue  4,   1975,   Page  415-420

L. L. Ban,   D. Crawford,   H. Marsh,  

Preview   |   PDF (2506KB)

3. A new small‐angle X‐ray scattering facility utilizing a rotating anode, pin‐hole collimation and a position‐sensitive proportional counter
  Journal of Applied Crystallography,   Volume  8,   Issue  4,   1975,   Page  421-429

J. Schelten,   R. W. Hendricks,  

Preview   |   PDF (1031KB)

4. On the method of obtaining the residual stress, stacking fault probability and other parameters from an analysis of peak shifts of several Bragg peaks
  Journal of Applied Crystallography,   Volume  8,   Issue  4,   1975,   Page  430-435

R. H. Marion,   J. B. Cohen,  

Preview   |   PDF (628KB)

5. Synchrotron radiation – its application to high‐speed, high‐resolution X‐ray diffraction topography
  Journal of Applied Crystallography,   Volume  8,   Issue  4,   1975,   Page  436-444

M. Hart,  

Preview   |   PDF (2691KB)

6. Determination of angles between blocks from the topographs obtained by the Schultz method
  Journal of Applied Crystallography,   Volume  8,   Issue  4,   1975,   Page  445-451

V. V. Aristov,   E. V. Shulakov,  

Preview   |   PDF (1603KB)

7. Accurate lattice constants from multiple diffraction measurements. I. Geometry, techniques and systematic errors
  Journal of Applied Crystallography,   Volume  8,   Issue  4,   1975,   Page  452-456

B. Post,  

Preview   |   PDF (538KB)

8. Accurate lattice constants from multiple reflection measurements. II. Lattice constants of germanium silicon, and diamond
  Journal of Applied Crystallography,   Volume  8,   Issue  4,   1975,   Page  457-458

T. Hom,   W. Kiszenik,   B. Post,  

Preview   |   PDF (220KB)

9. X‐ray measurements of strain and mosaic particle size in annealed tungsten powder
  Journal of Applied Crystallography,   Volume  8,   Issue  4,   1975,   Page  459-464

J. P. Urban,  

Preview   |   PDF (683KB)

10. Gebogene Kupfermonochromatoren für Neutronen
  Journal of Applied Crystallography,   Volume  8,   Issue  4,   1975,   Page  465-468

D. Hohlwein,  

Preview   |   PDF (375KB)

首页 上一页 下一页 尾页 第1页 共21条