Journal of Applied Crystallography


ISSN: 1600-5767        年代:1989
当前卷期:Volume 22  issue 4     [ 查看所有卷期 ]

年代:1989
 
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1. X‐ray diffraction line broadening due to dislocations in non‐cubic crystalline materials. III. Experimental results for plastically deformed zirconium
  Journal of Applied Crystallography,   Volume  22,   Issue  4,   1989,   Page  299-307

R. Kužel,   P. Klimanek,  

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2. Diffraction from quasi‐crystals and disordered twinned aggregates
  Journal of Applied Crystallography,   Volume  22,   Issue  4,   1989,   Page  308-314

T. R. Welberry,  

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3. Modeling of Bragg intensity profiles. 1. Allowance for crystal mosaicity
  Journal of Applied Crystallography,   Volume  22,   Issue  4,   1989,   Page  315-320

A. V. Laktionov,   A. I. Chulichkov,   N. M. Chulichkova,   G. V. Fetisov,   Yu. P. Pyt'ev,   L. A. Aslanov,  

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4. Electronically focused time‐of‐flight powder diffractometers at the intense pulsed neutron source
  Journal of Applied Crystallography,   Volume  22,   Issue  4,   1989,   Page  321-333

J. D. Jorgensen,   J. Faber,   J. M. Carpenter,   R. K. Crawford,   J. R. Haumann,   R. L. Hitterman,   R. Kleb,   G. E. Ostrowski,   F. J. Rotella,   T. G. Worlton,  

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5. An X‐ray monochromator system using successive reflection and its application to measurements of diffraction curves of annealed GaAs wafers
  Journal of Applied Crystallography,   Volume  22,   Issue  4,   1989,   Page  334-339

T. Fukumori,   K. Futagami,  

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6. Crystallization of low‐molecular‐weight organic compounds for X‐ray crystallography
  Journal of Applied Crystallography,   Volume  22,   Issue  4,   1989,   Page  340-344

P. Van Der Sluis,   A. M. F. Hezemans,   J. Kroon,  

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7. Stress distribution and lattice curvature determinations in multilayer structures by simulation of X‐ray rocking curves
  Journal of Applied Crystallography,   Volume  22,   Issue  4,   1989,   Page  345-351

F. Cembali,   M. Servidori,  

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8. Polarized neutron scattering by polarized protons of bovine serum albumin in deuterated solvent
  Journal of Applied Crystallography,   Volume  22,   Issue  4,   1989,   Page  352-362

W. Knop,   H.‐J. Schink,   H. B. Stuhrmann,   R. Wagner,   M. Wenkow‐Es‐Souni,   O. Schärpf,   M. Krumpolc,   T. O. Niinikoski,   M. Rieubland,   A. Rijllart,  

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9. The determination of crystal size and disorder from X‐ray diffraction photographs of polymer fibres. 1. The accuracy of determination of Fourier coefficients of the intensity profile of a reflection
  Journal of Applied Crystallography,   Volume  22,   Issue  4,   1989,   Page  363-371

R. Somashekar,   I. H. Hall,   P. D. Carr,  

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10. X‐ray diffractometry of AlGaAs/GaAs superlattices and GaAs in the temperature range 5–295 K
  Journal of Applied Crystallography,   Volume  22,   Issue  4,   1989,   Page  372-375

G. Clec'h,   G. Calvarin,   P. Auvray,   M. Baudet,  

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