Journal of Applied Crystallography


ISSN: 1600-5767        年代:1993
当前卷期:Volume 26  issue 4     [ 查看所有卷期 ]

年代:1993
 
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1. Equations for diffuse scattering from pseudobinary sphaleriteF3msystems
  Journal of Applied Crystallography,   Volume  26,   Issue  4,   1993,   Page  501-511

J. P. Quintana,  

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2. Indirect transformation in reciprocal space: desmearing of small‐angle scattering data from partially ordered systems
  Journal of Applied Crystallography,   Volume  26,   Issue  4,   1993,   Page  512-518

O. Glatter,   K. Gruber,  

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3. Fractal neutron optics multilayers in Cantor ternary set pattern
  Journal of Applied Crystallography,   Volume  26,   Issue  4,   1993,   Page  519-524

M. Mâaza,   B. Pardo,   T. Megademini,  

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4. Application of symmetrized harmonics expansion to correction of the preferred orientation effect
  Journal of Applied Crystallography,   Volume  26,   Issue  4,   1993,   Page  525-531

M. Järvinen,  

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5. Influence of misoriented substrates and dislocations on the diffraction patterns of superlattices
  Journal of Applied Crystallography,   Volume  26,   Issue  4,   1993,   Page  532-538

B. Rosner,   H. Berger,  

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6. Remeasurement of the profile of the characteristic CuKα emission line with high precision and accuracy
  Journal of Applied Crystallography,   Volume  26,   Issue  4,   1993,   Page  539-548

J. Härtwig,   G. Hölzer,   J. Wolf,   E. Förster,  

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7. Relation between the optical properties and structure of KLiSO4in the room‐temperature phase
  Journal of Applied Crystallography,   Volume  26,   Issue  4,   1993,   Page  549-554

J. Ortega,   J. Etxebarria,   T. Breczewski,  

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8. The absolute optical chirality of KLiSO4
  Journal of Applied Crystallography,   Volume  26,   Issue  4,   1993,   Page  555-557

K. Stadnicka,   A. M. Glazer,   S. Arzt,  

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9. ASTEC: an automated system for sitting‐drop protein crystallization
  Journal of Applied Crystallography,   Volume  26,   Issue  4,   1993,   Page  558-562

T. M. B. Soriano,   J. C. Fontecilla‐Camps,  

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10. Potential of the INEL X‐ray position‐sensitive detector: a general study of the Debye–Scherrer setting
  Journal of Applied Crystallography,   Volume  26,   Issue  4,   1993,   Page  563-569

M. Evain,   P. Deniard,   A. Jouanneaux,   R. Brec,  

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