Journal of Applied Crystallography


ISSN: 1600-5767        年代:1984
当前卷期:Volume 17  issue 5     [ 查看所有卷期 ]

年代:1984
 
     Volume 17  issue 1   
     Volume 17  issue 2   
     Volume 17  issue 3   
     Volume 17  issue 4   
     Volume 17  issue 5
     Volume 17  issue 6   
1. The effect of profile‐step counting time on the determination of crystal structure parameters by X‐ray Rietveld analysis
  Journal of Applied Crystallography,   Volume  17,   Issue  5,   1984,   Page  297-306

R. J. Hill,   I. C. Madsen,  

Preview   |   PDF (905KB)

2. The many‐beam moiré effect in electron micrographs of epitaxic Sn/SnTe layers
  Journal of Applied Crystallography,   Volume  17,   Issue  5,   1984,   Page  307-314

K. Kranjc,   D. Kunstelj,   P. Pećina,   V. Marinković,  

Preview   |   PDF (2570KB)

3. Vibrating crystals as possible neutron monochromators
  Journal of Applied Crystallography,   Volume  17,   Issue  5,   1984,   Page  315-319

A. D. Stoica,   M. Popovici,  

Preview   |   PDF (481KB)

4. Dislocations in energetic materials. 2. Characterization of the growth‐induced dislocation structure of pentaerythritol tetranitrate (PETN)
  Journal of Applied Crystallography,   Volume  17,   Issue  5,   1984,   Page  320-327

P. J. Halfpenny,   K. J. Roberts,   J. N. Sherwood,  

Preview   |   PDF (1694KB)

5. The formation of macroscopic polytypic regions in ZnS crystals
  Journal of Applied Crystallography,   Volume  17,   Issue  5,   1984,   Page  328-330

S. Mardix,  

Preview   |   PDF (879KB)

6. The true unit cell of ammonium hydrogen sulfate, (NH4)3H(SO4)2
  Journal of Applied Crystallography,   Volume  17,   Issue  5,   1984,   Page  331-333

B. L. Davis,   L. R. Johnson,  

Preview   |   PDF (312KB)

7. Enhancement of the `auto‐indexing' method for cell determination in four‐circle diffractometry
  Journal of Applied Crystallography,   Volume  17,   Issue  5,   1984,   Page  334-336

W. Clegg,  

Preview   |   PDF (370KB)

8. A new high‐resolution small‐angle X‐ray scattering apparatus using a fine‐focus rotating anode, point‐focusing collimation and a position‐sensitive proportional counter
  Journal of Applied Crystallography,   Volume  17,   Issue  5,   1984,   Page  337-343

O. Yoda,  

Preview   |   PDF (1758KB)

9. Determination of the anomalous scattering factors for Cu, Ni and Ti using the dispersion relation
  Journal of Applied Crystallography,   Volume  17,   Issue  5,   1984,   Page  344-351

J. J. Hoyt,   D. De Fontaine,   W. K. Warburton,  

Preview   |   PDF (812KB)

10. A Voigtian as profile shape function in Rietveld refinement
  Journal of Applied Crystallography,   Volume  17,   Issue  5,   1984,   Page  352-357

M. Ahtee,   L. Unonius,   M. Nurmela,   P. Suortti,  

Preview   |   PDF (580KB)

首页 上一页 下一页 尾页 第1页 共22条