Journal of Applied Crystallography


ISSN: 1600-5767        年代:1993
当前卷期:Volume 26  issue 3     [ 查看所有卷期 ]

年代:1993
 
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1. Comparison of radiation‐induced decay and structure refinement from X‐ray data collected from lysozyme crystals at low and ambient temperatures
  Journal of Applied Crystallography,   Volume  26,   Issue  3,   1993,   Page  309-319

A. C. M. Young,   J. C. Dewan,   C. Nave,   R. F. Tilton,  

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2. Algorithm for sorting diffraction data from a sample consisting of several crystals enclosed in a sample environment apparatus
  Journal of Applied Crystallography,   Volume  26,   Issue  3,   1993,   Page  320-326

S. W. Johnson,   M. Nicol,   D. Schiferl,  

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3. Tunneling reflection with polarized slow neutrons: polarized‐neutron total frustrated reflection
  Journal of Applied Crystallography,   Volume  26,   Issue  3,   1993,   Page  327-333

M. Mâaza,   B. Pardo,   F. Bridou,  

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4. Determination of diffusion coefficientDand activation energyQaof nickel into titanium in Ni–Ti multilayers by grazing‐angle neutron reflectometry
  Journal of Applied Crystallography,   Volume  26,   Issue  3,   1993,   Page  334-342

M. Mâaza,   C. Sella,   J. P. Ambroise,   M. Kâabouchi,   M. Milôche,   F. Wehling,   M. Groos,  

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5. Completion and refinement of crystal structures withSIR92
  Journal of Applied Crystallography,   Volume  26,   Issue  3,   1993,   Page  343-350

A. Altomare,   G. Cascarano,   C. Giacovazzo,   A. Guagliardi,  

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6. A theoretical model for the correction of intensity aberrations in Bragg–Brentano X‐ray diffractometers – detailed description of the algorithm
  Journal of Applied Crystallography,   Volume  26,   Issue  3,   1993,   Page  351-356

C. E. Matulis,   J. C. Taylor,  

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7. Multiple small‐angle scattering: an experimental investigation
  Journal of Applied Crystallography,   Volume  26,   Issue  3,   1993,   Page  357-362

S. Mazumder,   A. Sequeira,   S. K. Roy,   A. B. Biswas,  

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8. Location of rare‐earth atoms in isomorphous series of complex oxides by employment of difference Fourier syntheses based on X‐ray powder profile analysis: La3LnBaCu5O13+δ(Ln = Y, La, Nd or Gd) and LnBa2Cu3O7±δ(Ln = Y, Nd, Pr, Gd or Dy)
  Journal of Applied Crystallography,   Volume  26,   Issue  3,   1993,   Page  363-367

N. Rangavittal,   T. N. Guru Row,   C. N. R. Rao,  

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9. Powerful new software for the simulation of WAXS and SAXS diagrams
  Journal of Applied Crystallography,   Volume  26,   Issue  3,   1993,   Page  368-383

D. Espinat,   F. Thevenot,   J. Grimoud,   K. El Malki,  

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10. The determination of unit‐cell parameters from a Laue diffraction pattern
  Journal of Applied Crystallography,   Volume  26,   Issue  3,   1993,   Page  384-387

P. D. Carr,   I. M. Dodd,   M. M. Harding,  

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