Journal of Applied Crystallography


ISSN: 1600-5767        年代:1995
当前卷期:Volume 28  issue 3     [ 查看所有卷期 ]

年代:1995
 
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1. Empirical Texture Corrections for Asymmetric Diffraction and Inclined Textures
  Journal of Applied Crystallography,   Volume  28,   Issue  3,   1995,   Page  247-253

R. Cerný,   V. Valvoda,   M. Chládek,  

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2. On the Principle of a Geometric Mean of Even‐Rank Symmetric Tensors for Textured Polycrystals
  Journal of Applied Crystallography,   Volume  28,   Issue  3,   1995,   Page  254-266

S. Matthies,   M. Humbert,  

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3. Study of Imperfections and Structure in Nonlinear‐Optical Crystals of β‐BaB2O4
  Journal of Applied Crystallography,   Volume  28,   Issue  3,   1995,   Page  267-273

Q. L. Zhao,  

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4. Effects of Surface Relaxation on Powder Diffraction Patterns of Very Fine Particles
  Journal of Applied Crystallography,   Volume  28,   Issue  3,   1995,   Page  274-278

A. C. Nunes,   D. Lin,  

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5. Fourier Filtering of Synchrotron White‐Beam Topographs
  Journal of Applied Crystallography,   Volume  28,   Issue  3,   1995,   Page  279-288

M. Pilard,   Y. Epelboin,   A. Soyer,  

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6. Misorientation‐Angle Distribution of Randomly Oriented Symmetric Objects
  Journal of Applied Crystallography,   Volume  28,   Issue  3,   1995,   Page  289-293

A. Morawiec,  

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7. Study of Growth Defects and Structure in Nonlinear‐Optical Crystals of Lithium Boric Oxide
  Journal of Applied Crystallography,   Volume  28,   Issue  3,   1995,   Page  294-301

Q. L. Zhao,   Y. S. Huang,   D. Y. Tang,   A. D. Jiang,   W. Z. Zhong,   S. K. Hua,  

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8. The Isoscattering Points in X‐ray or Neutron Scattering Curves of One‐ and Two‐Dimensional Systems Measured by the Contrast‐Variation Method
  Journal of Applied Crystallography,   Volume  28,   Issue  3,   1995,   Page  302-305

T. Kawaguchi,  

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9. Thermal Expansion of Caesium Halides with the CsCl Structure
  Journal of Applied Crystallography,   Volume  28,   Issue  3,   1995,   Page  306-313

K. Wang,   R. R. Reeber,  

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10. A Novel Beam‐Conditioning Monochromator for High‐Resolution X‐ray Diffraction
  Journal of Applied Crystallography,   Volume  28,   Issue  3,   1995,   Page  314-317

N. Loxley,   B. K. Tanner,   D. K. Bowen,  

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