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Quality and Reliability Engineering International


ISSN: 0748-8017        年代：1985
当前卷期：Volume 1  issue 1     [ 查看所有卷期 ]

年代：1985
 
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11. Failure Mechanisms in Semiconductor Devices, E. A. AMERASEKERA, (to be published by Gordon&Breach Science Publishers)
  Quality and Reliability Engineering International,   Volume  1,   Issue  1,   1985,   Page  62-63

Svend M. Aagesen,  

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12. Applied Life Data Analysis. Author WAYNE NELSON, Wiley, New York. 1982. No. of pages: 650. Price: £52.65: $63.20
  Quality and Reliability Engineering International,   Volume  1,   Issue  1,   1985,   Page  63-64

Norman Harris,  

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13. Practical Statistical Analysis for the Reliability Engineer, K. A. Dey, Reliability Analysis Center State‐of‐the‐art Report (SOAR)‐2, 1983
  Quality and Reliability Engineering International,   Volume  1,   Issue  1,   1985,   Page  64-64

P. D. T. O'Connor,  

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14. Reliability Growth Testing Effectiveness, P. R. MacDiarmind and S. F. Morris. Rome Air Development Center Report RADC‐TR–84–20
  Quality and Reliability Engineering International,   Volume  1,   Issue  1,   1985,   Page  65-65

P. D. T. O'Connor,  

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15. Independent test houses
  Quality and Reliability Engineering International,   Volume  1,   Issue  1,   1985,   Page  66-67

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16. Masthead
  Quality and Reliability Engineering International,   Volume  1,   Issue  1,   1985,   Page  -

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