Quality and Reliability Engineering International


ISSN: 0748-8017        年代:1986
当前卷期:Volume 2  issue 3     [ 查看所有卷期 ]

年代:1986
 
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     Volume 2  issue 4   
1. Quality, reliability and scientific research
  Quality and Reliability Engineering International,   Volume  2,   Issue  3,   1986,   Page  141-142

FINN JENSE.,  

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2. Use of liquid‐crystal thermography for defect location on semiconductor devices
  Quality and Reliability Engineering International,   Volume  2,   Issue  3,   1986,   Page  143-151

F. Beck,  

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3. Calculation of optimum proof test intervals for maximum availability
  Quality and Reliability Engineering International,   Volume  2,   Issue  3,   1986,   Page  153-158

Geoff R. Duke,  

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4. The test needs of application‐specific integrated circuits
  Quality and Reliability Engineering International,   Volume  2,   Issue  3,   1986,   Page  159-164

Chris Davison,  

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5. Cathode ray tube bleed resistor reliability—a case study
  Quality and Reliability Engineering International,   Volume  2,   Issue  3,   1986,   Page  165-170

Peter Hale,   Iain Mactaggart,   Martin Shaw,  

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6. Production reliability in flexible manufacturing systems
  Quality and Reliability Engineering International,   Volume  2,   Issue  3,   1986,   Page  171-182

K. Khodabandehloo,   R. S. Sayles,  

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7. Optimum replacement of deteriorating and inadequate equipment
  Quality and Reliability Engineering International,   Volume  2,   Issue  3,   1986,   Page  183-198

H. S. Blanks,   M. J. Tordon,  

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8. Fatigue analysis for crack initiation
  Quality and Reliability Engineering International,   Volume  2,   Issue  3,   1986,   Page  199-208

Charles C. S. Yen,  

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9. News Digest
  Quality and Reliability Engineering International,   Volume  2,   Issue  3,   1986,   Page  209-212

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10. Research And Methods
  Quality and Reliability Engineering International,   Volume  2,   Issue  3,   1986,   Page  213-214

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