Quality and Reliability Engineering International


ISSN: 0748-8017        年代:1992
当前卷期:Volume 8  issue 5     [ 查看所有卷期 ]

年代:1992
 
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1. Broadening the reliability and quality horizons
  Quality and Reliability Engineering International,   Volume  8,   Issue  5,   1992,   Page  387-388

SAMUEL J . KEENE,  

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2. Standards on quality and reliability
  Quality and Reliability Engineering International,   Volume  8,   Issue  5,   1992,   Page  389-389

Finn Jensen,   Henry Malec,   Pat O'connor,   William E. Conway,  

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3. What happened to the system perspective in reliability?
  Quality and Reliability Engineering International,   Volume  8,   Issue  5,   1992,   Page  391-412

M. Halverson,   D. Ozdes,  

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4. Applications of hazard rate profile to software reliability prediction. Growth modelling and allocation
  Quality and Reliability Engineering International,   Volume  8,   Issue  5,   1992,   Page  413-418

Michael A. Friedman,  

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5. Combined hardware and software aspects of reliability
  Quality and Reliability Engineering International,   Volume  8,   Issue  5,   1992,   Page  419-426

Samuel Keene,   Chris Lane,  

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6. Assuring quality of the human–computer interface
  Quality and Reliability Engineering International,   Volume  8,   Issue  5,   1992,   Page  427-440

Henry J. Kohoutek,  

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7. Using the economic point of truncation process for new product introduction
  Quality and Reliability Engineering International,   Volume  8,   Issue  5,   1992,   Page  441-455

James T. Zurn,  

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8. Software reliability model selection
  Quality and Reliability Engineering International,   Volume  8,   Issue  5,   1992,   Page  457-469

Taghi M. Khoshgoftaar,   Timothy G. Woodcock,  

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9. System reliability analysis using factorization techniques
  Quality and Reliability Engineering International,   Volume  8,   Issue  5,   1992,   Page  471-476

M. Stephen Kendall,   Judith W. Koslov,   Robert B. Wood,  

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10. Quality and reliability assessment of hardware and software during the total product life cycle
  Quality and Reliability Engineering International,   Volume  8,   Issue  5,   1992,   Page  477-483

David R. Jones,   Vyasaraj Murthy,   Jeffrey Blanchard,  

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