ISSN:0748-8017    

DOI:10.1002/qre.4680090602

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1993

数据来源: WILEY

摘要:

AbstractThis paper deals with the binary‐input‐and‐binary‐output (BIBO) dynamic parameter design problem. In the Taguchi two‐step procedure, the settings of control factors are first determined such that the so‐called standardized SN ratio is maximized, and then the levelling factor is adjusted to achieve the desired proportion of misclassification probabilities. The standardized SN ratio ηs is calculated assuming that levelling is conducted to make both misclassification probabilities equal. Then, a question arises whether or not ηs is still a valid measure for comparing different designs when the desired ratio α of the two misclassification probabilities is not 1 (as in some chemical or metallurgical separations). In addition, Taguchi did not explain what the optimization criterion is in the above two‐step procedure. In this paper, we first show that using ηs in the Taguchi approach can be justified even for the case where α is not 1. Then, we formulate the BIBO parameter design problem in terms of minimizing expected quadratic loss, and show that the Taguchi two‐step procedure can be also justified with respect to this criterion if a certain set of assumptions is satisfied. The appropriate value of

ISSN:0748-8017    

DOI:10.1002/qre.4680090603

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1993

数据来源: WILEY

摘要:

AbstractThe technique of ‘scanning’ with a laser beam permits a localization of latch‐up sites in CMOS technology with a resolution less than one micron. Electrical simulations correlated to experimental curves of ‘supply current’ versus ‘photo‐induced current’ offer a good evaluation of the predominant parameters of the para

ISSN:0748-8017    

DOI:10.1002/qre.4680090604

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1993

数据来源: WILEY

摘要:

AbstractSubmission of test components and representative MMICs to an extensive range of environmental and endurance tests has confirmed the suitability of polyimide as a dielectric layer for a high performance, reliable GaAs foundry process. In particular, the ability to withstand 1000 hours of 85 per cent RH, 85°C humidity testing has been demonstrated

ISSN:0748-8017    

DOI:10.1002/qre.4680090605

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1993

数据来源: WILEY

摘要:

AbstractThere has been a great amount of publicity aboutTaguchimethods which employ deterministic sampling techniques for robust design. Also given wide exposition in the literature istolerance designwhich achieves similar objectives but employs random sampling techniques. The question arises as to which approach—random or deterministic—is more suitable for robust design of integrated circuits. Robust design is a two‐step process and quality analysis—the first step—involves the estimation of ‘quality factors’, which measure the effect of noise on the quality of system performance. This paper concentrates on the quality analysis of integrated circuits. A comparison is made between the deterministic sampling technique based on Taguchi's orthogonal arrays and the random sampling technique based on the Monte Carlo method, the objective being to determine which of the two gives more reliable (i.e. more consistent) estimates of quality factors. Results obtained indicated that theMonte Carlo method gave estimates of quality which were at least 40 per cent more consistent than orthogonal arrays.Theaccuracy of prediction of quality by Taguchi's orthogonal arrays is strongly affected by the choice of parameter quantization levels—a disadvantage—since there is a very large number (theoretically infinite) of choices of quantization levels for each parameter of an integrated circuit. The cost of the Monte Carlo method is independent of the dimensionality (number of designable parameters), being governed only by the confidence levels required for quality factors, whereas the size of orthogonal array required for a given problem is partly dependent on the number of circuit parameters. Two integrated circuits—a 7‐parameter CMOS voltage reference and a 20‐parameter bipolar operational amplifier—were employed in the investigation. Quality factors of interest included performancevariability, acceptability(relative to customer specifications)

ISSN:0748-8017    

DOI:10.1002/qre.4680090606

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1993

数据来源: WILEY

摘要:

AbstractVarious models which may be used for quantitative assessment of hardware, software and human reliability are compared in this paper. Important comparison criteria are the system life cycle phase in which the model is intended to be used, the failure category and reliability means considered in the model, model purpose, and model characteristic such as model construction approach, model output and model input. The main objective is to present limitations in the use of current models for reliability assessment of computer‐based safety shutdown systems in the process industry and to provide recommendations on further model development. Main attention is given to presenting the overall concept of various models from a user's point of view rather than technical details of specific models. A new failure classification scheme is proposed which shows how hardware and software failures may be modelled in a common framewor

ISSN:0748-8017    

DOI:10.1002/qre.4680090607

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1993

数据来源: WILEY

摘要:

AbstractThe electromigration lifetime and the activation energy of the process are often determined by highly accelerated or fast methods. Some of these common methods have been simulated using a crack model of the defect. The TRACE, BEM and WIJET methods are considered and suggestions are made about the optimum test strategy.

ISSN:0748-8017    

DOI:10.1002/qre.4680090608

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1993

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680090609

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1993

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680090610

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1993

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680090611

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1993

数据来源: WILEY