Quality and Reliability Engineering International


ISSN: 0748-8017        年代:1991
当前卷期:Volume 7  issue 6     [ 查看所有卷期 ]

年代:1991
 
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     Volume 7  issue 6
1. Process capability indices—an overview of theory and practice
  Quality and Reliability Engineering International,   Volume  7,   Issue  6,   1991,   Page  437-448

Leslie J. Porter,   John S. Oakland,  

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2. Analysis of quality costs for identifying areas of quality improvement—a case study
  Quality and Reliability Engineering International,   Volume  7,   Issue  6,   1991,   Page  449-459

Bikash Bhadury,   M. K. Jain,  

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3. Reliability of multi‐channel Ga1−xAlxas high electron mobility transistor (HEMT) integrated circuits
  Quality and Reliability Engineering International,   Volume  7,   Issue  6,   1991,   Page  461-467

A. Christou,   Wen Tseng,  

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4. Transition from quality circles to total involvement in semiconductor manufacturing
  Quality and Reliability Engineering International,   Volume  7,   Issue  6,   1991,   Page  469-474

Carol A. Derry,  

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5. Choosing the best set of quality judges: A new quality tool
  Quality and Reliability Engineering International,   Volume  7,   Issue  6,   1991,   Page  475-478

Lorrie L. Hoffman,  

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6. Statistical monitoring and control of a low defect process
  Quality and Reliability Engineering International,   Volume  7,   Issue  6,   1991,   Page  479-483

T. N. Goh,  

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7. Good quality at low cost: Trends in quality assurance
  Quality and Reliability Engineering International,   Volume  7,   Issue  6,   1991,   Page  485-488

Werner Fleischhammer,  

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8. The physical basis for the roller‐coaster hazard rate curve for electronics
  Quality and Reliability Engineering International,   Volume  7,   Issue  6,   1991,   Page  489-495

Kam L. Wong,  

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9. Quantitative safety assessment of the ventilation recirculation system in an undersea mine
  Quality and Reliability Engineering International,   Volume  7,   Issue  6,   1991,   Page  497-510

John Andrews,  

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10. News digest
  Quality and Reliability Engineering International,   Volume  7,   Issue  6,   1991,   Page  511-514

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