ISSN:0748-8017    

DOI:10.1002/qre.4680050402

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1989

数据来源: WILEY

摘要:

AbstractLife data from systems of components are often analysed to estimate the reliability of the individual components. These estimates are useful since they reflect the reliability of the components under actual operating conditions. However, owing to the cost or time involved with failure analysis, the exact component causing system failure may be unknown or ‘masked’. That is, the cause may only be isolated to some subset of the system's components. We present an iterative approach for obtaining component reliability estimates from such data for series systems. The approach is analogous to traditional probability plotting. That is, it involves the fitting of a parametric reliability function to a set of nonparametric reliability estimates (plotting points). We present a numerical example assuming Weibull component life distributions and a two‐component series system. In this example we find estimates with only 4 per cent of the computation time required to find comparable

ISSN:0748-8017    

DOI:10.1002/qre.4680050403

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1989

数据来源: WILEY

摘要:

AbstractThis paper elucidates the role of the electronic component engineer in ensuring the reliability of electronic components for high reliability spacecraft applications. The reliability of electronic components is categorized in three areas of responsibility, attributable to the component manufacturer, the user and a shared responsibility between the two. The broad scope of the component engineer's responsibility extends from circuit design to system operation. Co‐operation with circuit design engineers for proper part application is emphasized, and the requirements for understanding the effects of environmental stresses on device material properties is treated. The importance of a close working relationship between the component engineer and the part supplier is also emphasize

ISSN:0748-8017    

DOI:10.1002/qre.4680050404

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1989

数据来源: WILEY

摘要:

AbstractThe problem of selection of a proper quality assurance and control programme for manufacturing of microelectronics devices is usually solved empirically by analogy with existing situations, or those experienced in the past. This problem is characterized by incomplete comprehension of influencing variables, unknown relationships among them, and their often vague definitions. This makes it an almost perfect candidate for application of methods from the theory of fuzzy sets and approximate reasoning. One such reasoning process is described here using familiar terms from the MIL‐HDBK‐217E, and is illustrated by an ASIC MOS device exam

ISSN:0748-8017    

DOI:10.1002/qre.4680050405

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1989

数据来源: WILEY

摘要:

AbstractThe formulation of total reliability assessment of integrated circuits involves an increasing amount of knowledge and data and hence it requires increasing computerized assistance. To perform this an information system has been designed and implemented. Following engineering practice, the key features of the system are (a) the collection of different types of data, e.g. electrical parameter measurements and qualitative description of the mode and the mechanism of failure and (b) the implementation of procedures coming from methods often applied, e.g. statistical or new approaches, such as formalization of cause—effect chains as studied for artificial intelligence applications. The system architecture has been designed so as to allow direct user maintenance, and hence a quick updating of reliability knowledge and information. Furthermore its modularity eases the implementation of new procedures. Computer support improves the quality of data analysis and allows for the application of new methods and model

ISSN:0748-8017    

DOI:10.1002/qre.4680050406

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1989

数据来源: WILEY

摘要:

AbstractThis paper presents a brief summary of fault‐detection methods using parameter estimation techniques. An overview of the fault‐detection system design methodology is first presented, followed by the principles of parameter‐estimation fault‐detection techniques. Applications from the field of industrial processes are given and finally a case study is described which applies the general techniques to the fault detection of D.C. motors using multiprocessor

ISSN:0748-8017    

DOI:10.1002/qre.4680050407

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1989

数据来源: WILEY

摘要:

AbstractOwing to ‘producer's liability for defective products’ the safety‐related components of vehicles have to be designed, tested and manufactured in an appropriate way. Some considerations are presented about useful procedures in design and testing of safety parts which may help to reach the required high reliability and minimize risks. Problem areas are indicated which need more research. In future the reliability approach in automotive industries will come closer to the standards in aeronautics. This trend is accelerated by the rapid use of electronics in automo

ISSN:0748-8017    

DOI:10.1002/qre.4680050408

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1989

数据来源: WILEY

摘要:

AbstractLow‐frequency (50 MHz) scanning acoustic microscopy has been applied to the problem of imaging defects in semiconductor packages. The results have been compared with the more established technique of X‐ray shadow imaging. The scanning acoustic microscope has been found to be able to image a greater variety of defects than X‐ray shadow imaging, although the acoustic image could often only be fully interpreted after comparison with the corresponding X‐ray image. Scanning acoustic microscopy is now proving to be a valuable analysis technique for the detection and characterisation of packaging related p

ISSN:0748-8017    

DOI:10.1002/qre.4680050409

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1989

数据来源: WILEY

摘要:

AbstractStatistical process control methods are usually applied in an environment when periodic sampling and rational subgrouping of process output is appropriate. The resulting summary statistics can be graphically displayed and analysed using either traditional Shewhart control charts or other charts such as those based on the cumulative sum. This article presents an alternative approach, based on time series analysis of all the real‐time process data. The time series approach is employed because the sequence of process observations may not be statistically independent. The autocorrelative structure in the data may be captured using an ARIMA model, and the residuals from this model are shown to be an effective input signal for a variety of statistical process control procedure

ISSN:0748-8017    

DOI:10.1002/qre.4680050410

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1989

数据来源: WILEY

摘要:

AbstractThis paper reviews current life‐testing practices applied to photodiodes, illustrated with examples from some recent work on commercial components. A description is given of the types of photodiode tested, followed by an explanation of the basic princples of life‐testing. Comparisons of biasing methods are made and the difficulties of testing certain photodiodes are discussed. It is shown that it is impossible to demonstrate high reliability in fibred packages (without using a very large number of devices on test), because of life‐test temperature limitations. Similarly, it is difficult to demonstrate high reliability for germanium avalanche photodiodes (APDs). It is also shown that it can be very difficult to demonstrate high reliability in devices which reach wear‐out within short times at relatively low life‐test temperatures. Recent results are presented which demonstrate that planar PIN photodiodes are superior to mesa PINs, and that planar InGaAs APDs can have an acceptable re

ISSN:0748-8017    

DOI:10.1002/qre.4680050411

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1989

数据来源: WILEY