Quality and Reliability Engineering International


ISSN: 0748-8017        年代:1987
当前卷期:Volume 3  issue 3     [ 查看所有卷期 ]

年代:1987
 
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1. When reliable means failure free
  Quality and Reliability Engineering International,   Volume  3,   Issue  3,   1987,   Page  145-145

Kam L. Wong,  

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2. Or, the wonderful “one‐hoss shay” a logical story oliver wendell holmes
  Quality and Reliability Engineering International,   Volume  3,   Issue  3,   1987,   Page  147-148

OLIVER WENDELL HOLMES,  

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3. Load‐strength modelling of mechanics and electronics
  Quality and Reliability Engineering International,   Volume  3,   Issue  3,   1987,   Page  149-155

Valter Loll,  

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4. Development of stress screens
  Quality and Reliability Engineering International,   Volume  3,   Issue  3,   1987,   Page  157-162

Gregg K. Hobbs,  

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5. Considerations in the use of optimal preventive maintenance policies
  Quality and Reliability Engineering International,   Volume  3,   Issue  3,   1987,   Page  163-167

Nicholas A. Zaino,  

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6. Quality assurance education and training in the U.K.
  Quality and Reliability Engineering International,   Volume  3,   Issue  3,   1987,   Page  169-175

John S. Oakland,   Ric Grayson,  

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7. Purple plague: Eliminated or just forgotten?
  Quality and Reliability Engineering International,   Volume  3,   Issue  3,   1987,   Page  177-184

P. K. Footner,   B. P. Richards,   R. B. Yates,  

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8. A rapid technique for assessing the moisture ingress susceptibility of plastic‐encapsulated integrated circuits
  Quality and Reliability Engineering International,   Volume  3,   Issue  3,   1987,   Page  185-193

E. J. Chwastek,   R. N. Shaw,  

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9. Influence of quality of manufacture on electronic equipment and system reliability
  Quality and Reliability Engineering International,   Volume  3,   Issue  3,   1987,   Page  195-201

Urs Ender,   Wolfgang Gerling,  

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10. News digest
  Quality and Reliability Engineering International,   Volume  3,   Issue  3,   1987,   Page  203-205

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