ISSN:0748-8017    

DOI:10.1002/qre.4680060502

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680060503

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

摘要:

AbstractIn this article the disadvantages of well‐known models for temperature–humidity induced failure mechanisms in plastic encapsulated microelectronic devices are shown. It is necessary to restrict the validity of these models. The advantage of bipolar transistors is that the failure mechanisms can be separated very easily. The most significant properties of polymers, plastication and glass transition, and also the diffusion of moisture will be described. The hydrolysis of chlorides is considered with respect to processes of polymeric physics and it is shown that chlorides form electrolytic distances and etchant inside the transistors. In this case the microelectronic devices change their electric characteristics and sometimes the electrical connection is interrupted. The model shows that the aggressiveness of the resin is affected by temperature and humidity and also how this aggressiveness affects the transistor. This model combines the mechanisms in the resin with the reactions of the devices. It provides a good basis for improving the reliability of microelectronic devices and for designing proper reliability te

ISSN:0748-8017    

DOI:10.1002/qre.4680060504

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

摘要:

AbstractThis paper describes procedures for predicting the growth rate of fatigue cracks in ship structure welds under sea‐wave loading as well as the stress corrosion cracking behaviour of steel in marine structures. A computer program which can be applied to assess the residual life‐time and to estimate the probability of failure of marine structures under wave action is presented. The main objective of applying this program is the development of an optimal inspection and maintenance policy for marine structures. Moreover, the presented computer program is of value to insurance companies in order to assess the safety level of a marine structure and consequently to estimate their financial r

ISSN:0748-8017    

DOI:10.1002/qre.4680060505

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

摘要:

AbstractComponents in electronic systems are often observed to be likely to fail at an early age, an effect well known as the ‘infant mortality’ effect. Similarly, for systems composed of such components, a decrease in the rate of occurrence of failures, usually called the ‘reliability improvement’ effect, is seen in the early operating period. In this paper we show that such improvement may be considered as a simple consequence of the heterogeneity among the components in the population. We present a simple three‐parameter model for the distribution of the component lifetime, which has a simple physical interpretation, and from which we obtain methods for statistical inference, suitable for implementation on even small computers. The methods have been applied successfully to field failure data, collected from an industria

ISSN:0748-8017    

DOI:10.1002/qre.4680060506

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

摘要:

AbstractIn the following paper we present a new model for crack propagation. The new model is able to involve sudden growth of crack length (jumps) and is a generalization of the well‐known Paris–Erdogen law. We obtain the lifetime distribution and the residual lifetime distributi

ISSN:0748-8017    

DOI:10.1002/qre.4680060507

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

摘要:

AbstractThis paper presents a practical methodology for the routine analysis of VLSI infant mortality data. Device families are modelled using established graphical parameter estimation techniques, and the model parameters are applied to individual device types within the family. Burn‐in requirements are calculated to achieve a desired early life reliability level. A technical summary of the methods is presented, and a small data set is analysed as an example. The analysis results from three large device families are also presente

ISSN:0748-8017    

DOI:10.1002/qre.4680060508

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

摘要:

AbstractThis paper outlines a new technique of statistical process control which goes a considerable way to resolving several existing problems. The technique described may be of particular value to automated control, small batch control and control of gauged processes. A new charting technique is described and compared with traditional control charts. The operation of the balance chart is outlined for attribute and variable processes and in precontrol mode. A graphical system for determining estimated Cp, Cpk and process mean values from limited process data is also included.

ISSN:0748-8017    

DOI:10.1002/qre.4680060509

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680060510

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680060511

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1990

数据来源: WILEY