Quality and Reliability Engineering International


ISSN: 0748-8017        年代:1994
当前卷期:Volume 10  issue 5     [ 查看所有卷期 ]

年代:1994
 
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1. Editor's Comment
  Quality and Reliability Engineering International,   Volume  10,   Issue  5,   1994,   Page  369-370

Valter Loll,  

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2. Product certification and standards for testing
  Quality and Reliability Engineering International,   Volume  10,   Issue  5,   1994,   Page  371-375

Valter Loll,  

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3. Knowledge‐based qualification tests for electronic components in harsh environments
  Quality and Reliability Engineering International,   Volume  10,   Issue  5,   1994,   Page  377-390

Jimmy M. Hu,  

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4. Practical reliability testing considerations
  Quality and Reliability Engineering International,   Volume  10,   Issue  5,   1994,   Page  391-398

Samuel J. Keene,   Paul Vattano,  

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5. Reliability engineering based on field information—The way ahead
  Quality and Reliability Engineering International,   Volume  10,   Issue  5,   1994,   Page  399-409

Jørgen Møltoft,  

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6. Best compromise test plans for weibull distributions with different censoring times
  Quality and Reliability Engineering International,   Volume  10,   Issue  5,   1994,   Page  411-415

Guangbin Yang,   Ling Jin,  

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7. Taguchi methods in practice: An analysis of Goh's paradox
  Quality and Reliability Engineering International,   Volume  10,   Issue  5,   1994,   Page  417-421

T. N. Goh,  

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8. Testing of a solder replacement technology
  Quality and Reliability Engineering International,   Volume  10,   Issue  5,   1994,   Page  423-434

Henrik L. Hvims,  

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9. A practical example for reduction of the call rate level
  Quality and Reliability Engineering International,   Volume  10,   Issue  5,   1994,   Page  435-436

Peter Rimmen,  

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10. Weibull analysis of fatigue test data
  Quality and Reliability Engineering International,   Volume  10,   Issue  5,   1994,   Page  437-438

Karl‐Erik Olsson,  

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