ISSN:0748-8017    

DOI:10.1002/qre.4680020202

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1986

数据来源: WILEY

摘要:

AbstractThe Taguchi methods have recently become popular in the U.S.A following a realization of their importance in Japanese quality design. This review is an initial attempt to extract the important ideas while drawing on the ‘Western’ experience with response surface methodology and experimental des

ISSN:0748-8017    

DOI:10.1002/qre.4680020203

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1986

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680020204

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1986

数据来源: WILEY

摘要:

AbstractThis paper starts from the main objections regarding MIL‐HDBK‐217 and the BELLCORE method for reliability prediction, objections asserting that these methods are approximate, complicated and unconvincing. To support these assertions, and by applying techniques specific to reliability theory, the author has developed a reliability model which is plausible for certain elements of technical systems. The existence of such a model, which in practice is useless because the failure rate expression is too complicated, proves clearly the inefficiency of classical meth

ISSN:0748-8017    

DOI:10.1002/qre.4680020205

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1986

数据来源: WILEY

摘要:

AbstractThe electrostatic discharge (ESD) sensitivity of small dimensionn‐channel metal oxide semiconductor (NMOS) field effect transistors (FETs) has been investigated. NMOS FETs of varying dimensions and a constant gate oxide thickness of 400® were each subjected to a single ESD voltage pulse of between 50 and 250V at temperatures between 25 and 200°C. Over 4000 devices were used, all resident on a single 3 inch silicon wafer. The object of the experiment was to determine the dependence of device ESD sensitivity on temperature, voltage and device dimensions as well as to investigate the mechanisms that cause oxide breakdown as a result of ESD damage.No temperature dependence of device ESD sensitivity was observed within the range of the experiment. A significant voltage dependence was observed, with degradation accounting for over 80 per cent of devices at 250V. A cumulative ESD effect was observed, whereby the degradation of device performance was found to increase with the number of applied pulses. Analysis of the breakdown characteristics revealed that the cause of damage was oxide breakdown. Application of the ESD pulse appears to lead to oxide breakdown through impact ionization within the oxide, the very short duration of the pulse not being favourable to processes involving electron trapping unless these traps are already present in the ox

ISSN:0748-8017    

DOI:10.1002/qre.4680020206

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1986

数据来源: WILEY

摘要:

AbstractMarkov models are an established part of current systems reliability and availability analysis. They are extensively used in various applications, including, in particular, electrical power supply systems. One of their advantages is that they considerably simplify availability evaluation so that the availability of very large and complex systems can be computed. It is generally assumed, with some justification, that the results obtained from such Markov reliability models are relatively robust.It has, however, been known for some time, that practicaltime to failure distributionsare frequently non‐exponential, particular attention being given in much reliability work to the Weibull family. Morover, recently additional doubt has been case on the validity of the Markov approach, both because of the work of Professor Kline and others on the non‐exponentiality of practicalrepair time distribution, and because of the advantages to be obtained in terms of modelling visibility of the alternative simulation approach.In this paper we employ results on the ability of thek‐out‐of‐nsystems to span the coherent set to investigate the robustness of Markov reliability models based upon a simulation investigation of coherent systems of up to 10 identical components. We treat the case where adequate repair facilities are available for all components. The effects upon the conventional transient and steady‐state measures of Weibull departures from exponentiality are considered. In general, the Markov models are found to be relatively robust, with alterations to failure distributions being more important than those to repair distributions, and decreasing hazard rates more critical than increasing hazard rates. Of the measures studied, the mean time to failure is most sensitive to variations in distribut

ISSN:0748-8017    

DOI:10.1002/qre.4680020207

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1986

数据来源: WILEY

摘要:

AbstractThe changes in the quality assurance organization introduced in recent years in a Swiss firm have led to a substantial improvement in the production quality of electronic circuit boards and to an increase in the reliability of electronic systems. This article demonstrates that the operational reliability of such systems is determined to a great extent by weak points in the electronic components. It follows that an analysis of the causes and the avoidance of such weak points are paramount in controlling the reliability of electronic systems.

ISSN:0748-8017    

DOI:10.1002/qre.4680020208

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1986

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680020209

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1986

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680020210

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1986

数据来源: WILEY

ISSN:0748-8017    

DOI:10.1002/qre.4680020211

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1986

数据来源: WILEY