Quality and Reliability Engineering International


ISSN: 0748-8017        年代:1992
当前卷期:Volume 8  issue 2     [ 查看所有卷期 ]

年代:1992
 
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1. Editorial
  Quality and Reliability Engineering International,   Volume  8,   Issue  2,   1992,   Page  77-77

P.D.T.O' CONNOR,  

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2. Fault and cause diagnosis of casting defects: A case study
  Quality and Reliability Engineering International,   Volume  8,   Issue  2,   1992,   Page  79-91

F. B. J. Sweeting,   W. R. Thorpe,   A. N. Pettitt,  

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3. Low‐cost physical analysis techniques for the failure analysis of semiconductor components
  Quality and Reliability Engineering International,   Volume  8,   Issue  2,   1992,   Page  93-98

J. Y. Glacet,   G. Guerri Dall'oro,  

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4. Failures in thin metal film resistors—A case history
  Quality and Reliability Engineering International,   Volume  8,   Issue  2,   1992,   Page  99-104

J. F. Cain,   L. Hart,   J. R. McLean,  

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5. On the effectiveness of the unit sample size for standard control charts: ARL VS. Aurl
  Quality and Reliability Engineering International,   Volume  8,   Issue  2,   1992,   Page  105-111

Jeffrey M. Snow,   John S. Usher,   Bruce E. Stuckman,  

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6. Control chart design a review of standard practice
  Quality and Reliability Engineering International,   Volume  8,   Issue  2,   1992,   Page  113-122

Leslie J. Porter,   Roland Caulcutt,  

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7. Testing for reliability improvement or deterioration in repairable systems
  Quality and Reliability Engineering International,   Volume  8,   Issue  2,   1992,   Page  123-132

R. F. de La Mare,  

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8. Statistical analysis of an age model for imperfectly repaired systems
  Quality and Reliability Engineering International,   Volume  8,   Issue  2,   1992,   Page  133-146

R. Guo,   C. E. Love,  

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9. News Digest
  Quality and Reliability Engineering International,   Volume  8,   Issue  2,   1992,   Page  147-149

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10. International Calendar of Forthcoming Events
  Quality and Reliability Engineering International,   Volume  8,   Issue  2,   1992,   Page  150-153

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