Journal of Microscopy


ISSN: 0022-2720        年代:1985
当前卷期:Volume 139  issue 2     [ 查看所有卷期 ]

年代:1985
 
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1. HIGH RESOLUTION MAGNETIC MICROSTRUCTURE IMAGING USING SECONDARY ELECTRON SPIN POLARIZATION ANALYSIS IN A SCANNING ELECTRON MICROSCOPE
  Journal of Microscopy,   Volume  139,   Issue  2,   1985,   Page  1-2

J. Unguris,   G. G. Hembree,   R. J. Celotta,   D. T. Pierce,  

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2. The origins and development of scanning electron microscopy
  Journal of Microscopy,   Volume  139,   Issue  2,   1985,   Page  121-127

A. D. G. Stewart,  

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3. Recollections of the early days of SEM in the Cambridge University Engineering Department, 1948–53
  Journal of Microscopy,   Volume  139,   Issue  2,   1985,   Page  129-138

D. McMullan,  

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4. High resolution electron beam fabrication: a brief review of experimental studies that began at Cambridge University in 1962
  Journal of Microscopy,   Volume  139,   Issue  2,   1985,   Page  139-152

A. N. Broers,  

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5. The detective quantum efficiency of the scintillator/photomultiplier in the scanning electron microscope
  Journal of Microscopy,   Volume  139,   Issue  2,   1985,   Page  153-166

C. W. Oatley,  

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6. Scanning ion beam lithography and its application in microelectronics and microscopy
  Journal of Microscopy,   Volume  139,   Issue  2,   1985,   Page  167-175

H. Ahmed,  

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7. Astigmatism correction and determination of resolving power in the SEM
  Journal of Microscopy,   Volume  139,   Issue  2,   1985,   Page  177-185

K. C. A. Smith,  

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8. Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope
  Journal of Microscopy,   Volume  139,   Issue  2,   1985,   Page  187-196

Oliver C. Wells,  

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9. Assessment of electron irradiation damage to biomolecules using the Patterson function
  Journal of Microscopy,   Volume  139,   Issue  2,   1985,   Page  197-204

Manoj Misra,   R. F. Egerton,  

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10. An X‐ray diffraction analysis of rat tail tendons treated with Cupromeronic Blue
  Journal of Microscopy,   Volume  139,   Issue  2,   1985,   Page  205-219

K. M. Meek,   J. E. Scott,   C. Nave,  

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