Journal of Microscopy


ISSN: 0022-2720        年代:1994
当前卷期:Volume 176  issue 1     [ 查看所有卷期 ]

年代:1994
 
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     Volume 176  issue 1
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     Volume 176  issue 3   
1. The measurement of intracellular antigens and DNA by multiparametric flow cytometry
  Journal of Microscopy,   Volume  176,   Issue  1,   1994,   Page  1-7

R. S. CAMPLEJOHN,  

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2. Rapid estimation of bacterial antibiotic susceptibility with flow cytometry
  Journal of Microscopy,   Volume  176,   Issue  1,   1994,   Page  8-16

D. J. MASON,   R. ALLMAN,   J. M. STARK,   D. LLOYD,  

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3. Rapid assay for pathogenic salmonella organisms by immunofluorescence flow cytometry
  Journal of Microscopy,   Volume  176,   Issue  1,   1994,   Page  17-22

A. C. PINDER,   R. G. MCCLELLAND,  

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4. Scanning microphotolysis: A new photobleaching technique based on fast intensity modulation of a scanned laser beam and confocal imaging
  Journal of Microscopy,   Volume  176,   Issue  1,   1994,   Page  23-33

P. WEDEKIND,   U. KUBITSCHECK,   R. PETERS,  

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5. Light microscopical evaluation of pyrite oxidation of heap leached samples from a Pittsburgh seam coal
  Journal of Microscopy,   Volume  176,   Issue  1,   1994,   Page  34-44

G. A. IRDI,   H. B. BOOHER,  

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6. A comparison of the analysis of the Fresnel contrast in high‐ and low‐resolution images for the characterization of the rigid body displacements at a grain boundary
  Journal of Microscopy,   Volume  176,   Issue  1,   1994,   Page  45-53

S. H. STOBBS,   D. L. MEDLIN,   M. J. MILLS,   W. M. STOBBS,  

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7. Fractal characterization by frequency analysis: III. Effect of noise
  Journal of Microscopy,   Volume  176,   Issue  1,   1994,   Page  54-62

M. PANCORBO,   E. ANGUIANO,   M. AGUILAR,  

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8. Direct imaging in a water layer of human chromosome fibres composed of nucleosomes and their higher‐order structures by laser‐plasma X‐ray contact microscopy
  Journal of Microscopy,   Volume  176,   Issue  1,   1994,   Page  63-74

Y. KINJO,   K. SHINOHARA,   A. ITO,   H. NAKANO,   M. WATANABE,   Y. HORIIKE,   Y. KIKUCHI,   M. C. RICHARDSON,   K. A. TANAKA,  

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9. Relocation accuracy on HOME computerized microscopes
  Journal of Microscopy,   Volume  176,   Issue  1,   1994,   Page  75-82

J. H. TUCKER,   R. DYE,   J. SPREY,   C. SOWTER,   E. GRAY,   G. BRUGAL,  

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10. Book Reviews
  Journal of Microscopy,   Volume  176,   Issue  1,   1994,   Page  83-84

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