Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films


ISSN: 0734-2101        年代:1991
当前卷期:Volume 9  issue 2     [ 查看所有卷期 ]

年代:1991
 
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1. Scanning tunneling microscopy of collagen molecules
  Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films,   Volume  9,   Issue  2,   1991,   Page  179-181

X.‐Y. Zhu,   G. E. Poirier,   J. M. White,  

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2. A study of secondary ionization mechanism for LiF on Au by time‐of‐flight secondary ion mass spectrometry and direct recoil measurements
  Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films,   Volume  9,   Issue  2,   1991,   Page  190-194

Dae Won Moon,   Yang Sun Kim,   Jong Ho Kim,   Hee Jae Kang,  

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3. Photoemission study of the SiO2/Si interface structure of thin oxide films on Si(100), (111), and (110) surfaces
  Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films,   Volume  9,   Issue  2,   1991,   Page  195-200

Michio Niwano,   Hitoshi Katakura,   Yuki Takeda,   Yuji Takakuwa,   Nobuo Miyamoto,   Atsushi Hiraiwa,   Kunihiro Yagi,  

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4. High fidelity in Auger spectroscopy: Dependence on experimental parameters
  Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films,   Volume  9,   Issue  2,   1991,   Page  201-206

Hiroshi Saijo,   Yuji Konda,   Makoto Shiojiri,  

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5. Surface adsorption–migration kinetics
  Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films,   Volume  9,   Issue  2,   1991,   Page  207-211

Michael C. Fong,  

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6. Photon‐stimulated desorption study of a SiO2film surface
  Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films,   Volume  9,   Issue  2,   1991,   Page  212-216

M. Niwano,   Y. Takakuwa,   H. Katakura,   N. Miyamoto,  

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7. The interaction of Cl(2P3/2) and Cl(2P1/2) withn‐Si(100): Spontaneous etching
  Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films,   Volume  9,   Issue  2,   1991,   Page  217-222

W. Müller‐Markgraf,   M. J. Rossi,  

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8. Mechanisms of excimer laser cleaning of air‐exposed Si(100) surfaces studied by Auger electron spectroscopy, electron energy‐loss spectroscopy, reflection high‐energy electron diffraction, and secondary‐ion mass spectrometry
  Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films,   Volume  9,   Issue  2,   1991,   Page  223-227

R. Tsu,   D. Lubben,   T. R. Bramblett,   J. E. Greene,  

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9. Chemical etching of Si(111)‐(7×7) and Al/Si(111) by atomic hydrogen
  Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films,   Volume  9,   Issue  2,   1991,   Page  228-231

Chi‐Tzu Kao,   Lawrence H. Dubois,   Ralph G. Nuzzo,  

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10. Nuclear relaxation of deuterium–tritium adsorbed onto silica aerogel
  Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films,   Volume  9,   Issue  2,   1991,   Page  232-237

P. C. Souers,   E. M. Fearon,   J. D. Sater,   E. R. Mapoles,   J. R. Gaines,   P. A. Fedders,  

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