IEE Proceedings I (Solid-State and Electron Devices)


ISSN: null        年代:1985
当前卷期:Volume 132  issue 5     [ 查看所有卷期 ]

年代:1985
 
     Volume 132  issue 1   
     Volume 132  issue 2   
     Volume 132  issue 3   
     Volume 132  issue 4   
     Volume 132  issue 5
     Volume 132  issue 6   
1. Small signal bias dependent model for high frequency transistors
  IEE Proceedings I (Solid-State and Electron Devices),   Volume  132,   Issue  5,   1985,   Page  201-204

K.Bharath kumar,  

Preview   |   PDF (330KB)

2. Modelling bulk and surface recombination in the sidewall space-charge layer of an emitter-base junction
  IEE Proceedings I (Solid-State and Electron Devices),   Volume  132,   Issue  5,   1985,   Page  205-209

D.J.Roulston,   A.A.Eltoukhy,  

Preview   |   PDF (663KB)

3. Comparison of five high speed bistables by computer simulation
  IEE Proceedings I (Solid-State and Electron Devices),   Volume  132,   Issue  5,   1985,   Page  210-216

D.M.Russ,   D.W.Faulkner,  

Preview   |   PDF (668KB)

4. Monte carlo particle simulation of a GaAs MESFET with a gate trench sloping towards the source
  IEE Proceedings I (Solid-State and Electron Devices),   Volume  132,   Issue  5,   1985,   Page  217-223

C.Moglestue,  

Preview   |   PDF (828KB)

5. Microelectronic ion sensors: A critical survey
  IEE Proceedings I (Solid-State and Electron Devices),   Volume  132,   Issue  5,   1985,   Page  227-236

R.G.Kelly,   A.E.Owen,  

Preview   |   PDF (1532KB)

首页 上一页 下一页 尾页 第1页 共5条