1. |
Small-signal analysis of the travelling-wave gyrotron using pierce parameters |
|
IEE Proceedings I (Solid-State and Electron Devices),
Volume 127,
Issue 2,
1980,
Page 45-52
A.J.Sangster,
Preview
|
PDF (828KB)
|
|
摘要:
By comparing the travelling-wave gyrotron with the conventional travelling-wave tube, it is shown that the gyrotron interaction mechanism can be described using Pierce-type parameters. These parameters are subsequently employed to highlight some gain and frequency characteristics of the travelling-wave gyrotron, attention being focused particularly on harmonic operation.
DOI:10.1049/ip-i-1.1980.0009
出版商:IEE
年代:1980
数据来源: IET
|
2. |
Comparison of methods used for determining base spreading resistance |
|
IEE Proceedings I (Solid-State and Electron Devices),
Volume 127,
Issue 2,
1980,
Page 53-61
R.T.Unwin,
K.F.Knott,
Preview
|
PDF (959KB)
|
|
摘要:
A study of the many methods used for measuring base spreading resistance,rbb' has shown that some of them are inaccurate or unfeasible when applied to planar transistors. Methods investigated cover the d.c.to microwave frequency range and include coherent and incoherent signal measurements. Comparisons are also made of measured and theoretical values for several types of device. The thermal-noise method appears best because of its accuaracy and wide applicability.
DOI:10.1049/ip-i-1.1980.0010
出版商:IEE
年代:1980
数据来源: IET
|
3. |
Depletion-mode m.o.s.f.e.t. model including a field-dependent surface mobility |
|
IEE Proceedings I (Solid-State and Electron Devices),
Volume 127,
Issue 2,
1980,
Page 62-66
G.Baccarani,
F.Landini,
B.Riccò,
Preview
|
PDF (454KB)
|
|
摘要:
This paper presents an analytical model for depletion-mode m.o.s. transistors which is particularly suitable for c.a.d. applications, and improves the current state of the art by including the effect of the surface-mobility degradation induced by the transverse field. The model is used to fit experimental data obtained on long-channel devices, and turns out to give good results; the mean square error over the wholeID/VDSplane, for several values of the gate- and bulk-source voltages, is of the order of 1%
DOI:10.1049/ip-i-1.1980.0011
出版商:IEE
年代:1980
数据来源: IET
|
4. |
Punch-through diode as a power device |
|
IEE Proceedings I (Solid-State and Electron Devices),
Volume 127,
Issue 2,
1980,
Page 67-71
D.De Cogan,
Preview
|
PDF (494KB)
|
|
摘要:
The punch-through diode is a bidirectional nonlinear device whose speed of response makes it suitable for the suppression of very fast transients. It is autoprotecting above a minimum current density. A simple model to estimate the influence of design parameters on thermal properties is presented, and discrepancies in existing criteria for maximum power-handling capability are discussed.
DOI:10.1049/ip-i-1.1980.0012
出版商:IEE
年代:1980
数据来源: IET
|
5. |
Large-signal behaviour and capability of the transistor transit-time oscillator |
|
IEE Proceedings I (Solid-State and Electron Devices),
Volume 127,
Issue 2,
1980,
Page 72-77
Y.Druelle,
Y.Crosnier,
G.Salmer,
Preview
|
PDF (482KB)
|
|
摘要:
The transistor transit-time oscillator (t.t.t.) feasibility has been demonstrated in recent years. Small signal, negative resistance and oscillations were obtained and the main limitations were reported. The present paper gives device potential performances under large-signal c.w. operations and proposes an optimised structure for 10 GHz.
DOI:10.1049/ip-i-1.1980.0013
出版商:IEE
年代:1980
数据来源: IET
|
6. |
Baritt diodes for ka-band frequencies |
|
IEE Proceedings I (Solid-State and Electron Devices),
Volume 127,
Issue 2,
1980,
Page 78-80
J.Freyer,
P.N.Förg,
Preview
|
PDF (378KB)
|
|
摘要:
Design rules for uniformly doped Baritt diodes in the frequency range 8 to 40 GHz are derived. The fabrication of Ka-band Baritt diodes which deliver up to 1.7 mW is described. The theoretical and experimental results of the investigated diodes fit very well.
DOI:10.1049/ip-i-1.1980.0014
出版商:IEE
年代:1980
数据来源: IET
|
7. |
Techniques for analytically determining surface potential and mobility of an m.o.s. transistor |
|
IEE Proceedings I (Solid-State and Electron Devices),
Volume 127,
Issue 2,
1980,
Page 81-86
W.V.Backensto,
C.R.Viswanathan,
Preview
|
PDF (651KB)
|
|
摘要:
Techniques for evaluating the surface potential and the effective surface mobility of a m.o.s. transistor are described. These techniques include determination of the fixed oxide charge density, the surface-state charge density and the average donor concentration. The surface potential is evaluated as a function of gate voltage, because this dependence is necessary in order to calculate the density of surface states from charge-pumping measurements. The effective surface mobility is evaluated as a function of bias, because this dependence is necessary in order to develop a bias-dependent 1/fnoise model of a m.o.s. transistor.
DOI:10.1049/ip-i-1.1980.0015
出版商:IEE
年代:1980
数据来源: IET
|
8. |
Bias-dependent 1/fnoise model of an m.o.s. transistor |
|
IEE Proceedings I (Solid-State and Electron Devices),
Volume 127,
Issue 2,
1980,
Page 87-93
W.V.Backensto,
C.R.Viswananathan,
Preview
|
PDF (758KB)
|
|
摘要:
A 1/fnoise model of an m.o.s. transistor is developed which verifies previously observed dependences on the geometry and the density of surface states, but in addition predicts an explicit bias dependence. This model predicts that input 1/fvoltage noise gradually increases as the gate voltage increases near threshold and continues to increase for gate voltages well above threshold. It also predicts a gradual decrease in noise as the drain voltage increases to saturation. These prediction are experimentally verified.
DOI:10.1049/ip-i-1.1980.0016
出版商:IEE
年代:1980
数据来源: IET
|
9. |
Filament displacement and refraction losses in a stripe-geometry AIGaAs d.h. laser |
|
IEE Proceedings I (Solid-State and Electron Devices),
Volume 127,
Issue 2,
1980,
Page 94-97
D.Kerps,
Preview
|
PDF (436KB)
|
|
摘要:
The far-field, near-field and waist-intensity distributions are investigated in the nonlinear flux-current regime (kink) of a stripe-geometry d.h. laser at each of its two facets. The results are interpreted as a displacement of a deformable light guide or filament within the laser stripe, which acts as an additional built-in antiguide. Asymmetries in the far-field side-lobe intensities indicate enhanced refraction losses of the displaced filament towards that antiguide boundary towards which the near field moves and the far-field main lobe turns.
DOI:10.1049/ip-i-1.1980.0017
出版商:IEE
年代:1980
数据来源: IET
|
10. |
GaAs diode/f.e.t. logic circuits for high-speed-frequency-divider applications |
|
IEE Proceedings I (Solid-State and Electron Devices),
Volume 127,
Issue 2,
1980,
Page 98-99
J.Mun,
G.S.Sanghera,
S.D.Vanlint,
B.E.Barry,
Preview
|
PDF (284KB)
|
|
摘要:
This research note reports an improved circuit for GaAs diode/f.e.t. logic that is particularly suited for high-speed-frequency-divider applications. It is also demonstrated that there is a substantial power-reduction advantage in diode/f.e.t. logic over buffered-f.e.t. logic, even on single uniformly doped GaAs active layers. Comparisons have been made on these two logic approaches on i.c.s using nominally two-micrometre-gate-length f.e.t.s.. Propagation delays of 200 to 300 ps at 3 to 4 mW power consumption have been measured on diode/f.e.t. logic gates. Similar propagation delays are observed on buffered-f.e.t. logic, but at up to six times the bias power.
DOI:10.1049/ip-i-1.1980.0018
出版商:IEE
年代:1980
数据来源: IET
|