Philosophical Magazine Letters


ISSN: 0950-0839        年代:2000
当前卷期:Volume 80  issue 6     [ 查看所有卷期 ]

年代:2000
 
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1. A relationship among the components of the Eshelby tensor and its physical meaning in general inclusion problems
  Philosophical Magazine Letters,   Volume  80,   Issue  6,   2000,   Page  367-370

Susumu Onaka,  

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2. Investigation of {111} stacking faults and nanotwins in epitaxial BaTiO3thin films by high-resolution transmission electron microscopy
  Philosophical Magazine Letters,   Volume  80,   Issue  6,   2000,   Page  371-380

C.H. Lei,   C.L. Jia,   M. Siegert,   K. Urban,  

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3. High-resolution electron microscopy of a microporous carbon
  Philosophical Magazine Letters,   Volume  80,   Issue  6,   2000,   Page  381-386

P.J.F. Harris,   A. Burian,   S. Duber,  

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4. High-speed photography of low-velocity impact cracking of solid spheres
  Philosophical Magazine Letters,   Volume  80,   Issue  6,   2000,   Page  387-393

Rania Majzoub,   M. Munawar Chaudhri,  

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5. Use of electron channelling contrast imaging to assess near-surface mechanical damage
  Philosophical Magazine Letters,   Volume  80,   Issue  6,   2000,   Page  395-400

B.A. Simkin,   M.A. Crimp,  

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6. A thermodynamic model for nanocrystallization in bulk metallic glasses
  Philosophical Magazine Letters,   Volume  80,   Issue  6,   2000,   Page  401-409

P.J. Desre,  

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7. On the size dependence of the critical point of nanoscale interstitial solid solutions
  Philosophical Magazine Letters,   Volume  80,   Issue  6,   2000,   Page  411-418

Jorg Weissmuller,   Christian Lemier,  

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8. Foam coarsening under forced drainage
  Philosophical Magazine Letters,   Volume  80,   Issue  6,   2000,   Page  419-425

S. Hutzler,   D. Weaire,  

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9. Microstructural evolution of single-walled carbon nanotubes under electron irradiation
  Philosophical Magazine Letters,   Volume  80,   Issue  6,   2000,   Page  427-433

Y. Zhang,   S. Iijima,  

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10. Crystal growth and defect study of BiSbTe3
  Philosophical Magazine Letters,   Volume  80,   Issue  6,   2000,   Page  435-440

C.F. Desai,   S.N. Dhar,  

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