Philosophical Magazine Letters


ISSN: 0950-0839        年代:1992
当前卷期:Volume 65  issue 6     [ 查看所有卷期 ]

年代:1992
 
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1. Imaging of molecules, lattice and lattice defects in C60–C70fullerites by high-resolution electron microscopy
  Philosophical Magazine Letters,   Volume  65,   Issue  6,   1992,   Page  283-289

F. Banhart,   M. Forster,   W. Krätschmer,   H.-E. Schaefer,  

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2. Ab initiocalculations of the structure and dynamics of C60and C3−60
  Philosophical Magazine Letters,   Volume  65,   Issue  6,   1992,   Page  291-298

R. Jones,   C.D. Latham,   M.I. Heggie,   V.J. B. Torres,   S. Öberg,   S.K. Estreicher,  

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3. Preliminary high-resolution electron microscopy study of (1120) oriented Al2O3–Fe interfaces
  Philosophical Magazine Letters,   Volume  65,   Issue  6,   1992,   Page  299-309

T. Epicier,   C. Esnouf,   M.A. Smith,   D. Pope,  

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4. High-resolution electron microscopy image simulations on the R-Al5CuLi3icosahedral approximant phase
  Philosophical Magazine Letters,   Volume  65,   Issue  6,   1992,   Page  311-319

N. Tamura,   P. Guyot,   J.L. Verger-Gaugry,  

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5. Prediction of the configuration of a ‘Bardeen–Herring’ dislocation climb source under dynamic conditions
  Philosophical Magazine Letters,   Volume  65,   Issue  6,   1992,   Page  321-329

B. Burton,   D.T. Knight,  

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6. Rigid-body displacements at incoherent {112} Σ = 3 boundaries in Ni3Al
  Philosophical Magazine Letters,   Volume  65,   Issue  6,   1992,   Page  331-337

C.T. Forwood,   M.A. Gibson,  

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7. Long-ranged stress field produced by a planar assembly of edge dislocations: the effect of disorder
  Philosophical Magazine Letters,   Volume  65,   Issue  6,   1992,   Page  339-343

E. Bouchaud,   J.-P. Bouchaud,  

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