Philosophical Magazine Letters


ISSN: 0950-0839        年代:1997
当前卷期:Volume 76  issue 4     [ 查看所有卷期 ]

年代:1997
 
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1. Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)
  Philosophical Magazine Letters,   Volume  76,   Issue  4,   1997,   Page  237-246

J. Ahmed,   A.J. Wilkinson,   S.G. Roberts,  

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2. Transmission electron microscopy investigation of twinning in titanium carbonitride
  Philosophical Magazine Letters,   Volume  76,   Issue  4,   1997,   Page  247-258

K. Han,   G.C. Weatherly,  

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3. On the dislocation pole mechanism for twinning in TiAl crystals
  Philosophical Magazine Letters,   Volume  76,   Issue  4,   1997,   Page  259-268

M.H. Yoo,  

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4. Bauschinger effect in polycrystals of Ni Al with and 3 without boron
  Philosophical Magazine Letters,   Volume  76,   Issue  4,   1997,   Page  269-274

E.M. Schulson,   Y. Xu,  

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5. Viscous glide of a curved dislocation
  Philosophical Magazine Letters,   Volume  76,   Issue  4,   1997,   Page  275-280

R. Sedlacek,  

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6. Ab initio computational study of Ga in an Al grain boundary
  Philosophical Magazine Letters,   Volume  76,   Issue  4,   1997,   Page  281-288

D.I. Thomson,   V. Heine,   M.W. Finnis,   N. Marazi,  

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7. Atomic desorption process in nanometre-scale electron-beam drilling of MgO in high-resolution transmission electron microscopy
  Philosophical Magazine Letters,   Volume  76,   Issue  4,   1997,   Page  289-298

Tokushi Kizuka,   Nobuo Tanaka,  

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8. Initial interface reaction in indium/amorphous selenium multilayer thin films
  Philosophical Magazine Letters,   Volume  76,   Issue  4,   1997,   Page  299-305

K. Lu,   J.H. Perepezko,   K.A. Lindahl,   B. Lanning,  

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