|
21. |
R. Vanselow, R. F. Howe (Hrsg). Chemie und Physik von Festkörperoberflächen VII. Springer Series in Surface Sciences, Band 10 Herausgeber der Reihe G. Ertl und R. Gomer, Geschäftsführender Herausgeber H. K. V. Lotsch. Springer‐Verlag Berlin, Heidelberg, New York, London, Paris, Tokyo 1988, 616 Seiten, 315 Abbildungen, DM 159.00, ISBN 3‐540‐50044‐8 |
|
Crystal Research and Technology,
Volume 25,
Issue 1,
1990,
Page 96-96
A. Meisel,
Preview
|
PDF (75KB)
|
|
ISSN:0232-1300
DOI:10.1002/crat.2170250118
出版商:WILEY‐VCH Verlag
年代:1990
数据来源: WILEY
|
22. |
Solid inclusions in man‐made quartz crystals (I) microscopic investigations |
|
Crystal Research and Technology,
Volume 25,
Issue 1,
1990,
Page 97-104
G. K. Kirov,
Preview
|
PDF (596KB)
|
|
摘要:
AbstractMicroscopic study of a number of commercial and laboratory quartz crystals grown from Na‐alkaline solutions at about 350 °C show that they always contain fluid and solid inclusions. More than 99% of the inclusions in normally grown crystals occur at the seed plate or very close to it, not further than 0.2–0.5 mm. The solid inclusions occur as single particles, in small groups or in clusters and aggregates containing hundreds of various inclusions. Dimensions of single particles vary from 1 ton· 10 μm but separate inclusions and especially aggregates can measuren· 100 μm. Normally, the number of solid inclusions is of the order ofn· 100 per cm2but in separate “patches” measuring up to several cm2the density reaches ton· 1000 per cm2. Regardless of the origin of the host crystal, the solid inclusions are always of three kinds: 1. Quartz microcrystals — husks, whiskers, needles, and elongated plates which comprise up to 30% of all inclusions; 2. Several still unidentified non‐quartz phases, tentatively designated as “silicates” — euhedral and anhedral crystals with its refractive index greater than the index of quartz, and fine or submicroscopic elongated crystals of low index, which amount to 70%; 3. Technogene impurities consisting of small irregular opaque particles of metal oxides and presumably graphite which occur only sporadically. The formation of solid inclusions depends probably much more on the surface tension th
ISSN:0232-1300
DOI:10.1002/crat.2170250119
出版商:WILEY‐VCH Verlag
年代:1990
数据来源: WILEY
|
23. |
New X‐ray rietveld refinement of kaolinite from Keokuk, Iowa |
|
Crystal Research and Technology,
Volume 25,
Issue 1,
1990,
Page 105-110
Ľ. Smrčok,
D. Gyepesová,
M. Chmielová,
Preview
|
PDF (310KB)
|
|
摘要:
AbstractThe positions of 13 non‐hydrogen atoms in the structure of kaolinite from Keokuk, Iowa, were refined in the space group C1 using the constrained X‐ray Rietveld refinement. The precision and accuracy of the atomic positions are better than those previously reported. The most frequent e.s.d.'s of the positional parameters range from 0.003 to 0.005; the SiO bond distances are from the interval 1.56(4)–1.68(3) Å, and the AlO from 1.80 (5) to 2.07 (5) Å. The ditrigonalization angle α characteristic for tetrahedral sheet was found to be 9°, this value is in good agreement with the 11° reported from single crystal data. The correction for preferred orientation was in the form of exp (Gcos (2α)), the final factors of agreement wereRwp= 23.1%,RF=
ISSN:0232-1300
DOI:10.1002/crat.2170250120
出版商:WILEY‐VCH Verlag
年代:1990
数据来源: WILEY
|
24. |
Analytical theory for flexo‐electric domains in nematic layers |
|
Crystal Research and Technology,
Volume 25,
Issue 1,
1990,
Page 111-116
P. Schiller,
G. Pelzl,
D. Demus,
Preview
|
PDF (246KB)
|
|
摘要:
AbstractAn analytical theory for flexo‐electric domains in planar nematic films with positive dielectric anisotropy is proposed. It can be decided by a simple criterion, whether flexoelectric domains or the ordinary Fredericksz transition will occu
ISSN:0232-1300
DOI:10.1002/crat.2170250121
出版商:WILEY‐VCH Verlag
年代:1990
数据来源: WILEY
|
25. |
Masthead |
|
Crystal Research and Technology,
Volume 25,
Issue 1,
1990,
Page -
Preview
|
PDF (37KB)
|
|
ISSN:0232-1300
DOI:10.1002/crat.2170250101
出版商:WILEY‐VCH Verlag
年代:1990
数据来源: WILEY
|
|