Crystal Research and Technology


ISSN: 0232-1300        年代:1985
当前卷期:Volume 20  issue 5     [ 查看所有卷期 ]

年代:1985
 
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1. On the determination of [D] in a ternary FeCrNi alloy from a single specimen
  Crystal Research and Technology,   Volume  20,   Issue  5,   1985,   Page  47-49

M. T. Malik,   D. Bergner,  

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2. Sources of error in yield stress determination of doped crystals
  Crystal Research and Technology,   Volume  20,   Issue  5,   1985,   Page  50-51

M. Hartmanová,   G. A. Andreev,  

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3. Glow curves of thermally pre‐treated NaCl:Ba2crystals
  Crystal Research and Technology,   Volume  20,   Issue  5,   1985,   Page  52-54

K. Narasimha Reddy,   U. V. Subba Rao,  

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4. Graphoepitaxy of zinc oxide
  Crystal Research and Technology,   Volume  20,   Issue  5,   1985,   Page  55-57

V. I. Klykov,   N. M. Gladkov,  

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5. Crystal growth of SbSI from the molten phase
  Crystal Research and Technology,   Volume  20,   Issue  5,   1985,   Page  58-60

K. Ishikawa,   W. Tomoda,   H. Katsube,   K. Toyoda,  

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6. Single crystal growth of tin in useful shapes
  Crystal Research and Technology,   Volume  20,   Issue  5,   1985,   Page  61-64

S. K. Mohanlal,   D. Pathinettam Padiyan,  

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7. V. A. Frank‐Kamenetskii at the age of seventy
  Crystal Research and Technology,   Volume  20,   Issue  5,   1985,   Page  591-592

H. Neels,  

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8. A general treatment of X‐ray (residual) macro‐stress determination in textured cubic materials: General expressions, cubic invariancy and application to X‐ray strain pole figures
  Crystal Research and Technology,   Volume  20,   Issue  5,   1985,   Page  593-618

C. M. Brakman,  

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9. Ionicity of the chemical bond in Tl3XS4compounds
  Crystal Research and Technology,   Volume  20,   Issue  5,   1985,   Page  619-624

K. Čermák,  

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10. A correlation between concentration of deep levels and growth conditions for VPEGaP
  Crystal Research and Technology,   Volume  20,   Issue  5,   1985,   Page  625-633

W. Seifert,   K. Jacobs,   R. Pickenhain,   G. Biehne,  

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