X‐Ray Spectrometry


ISSN: 0049-8246        年代:1983
当前卷期:Volume 12  issue 3     [ 查看所有卷期 ]

年代:1983
 
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1. Editorial
  X‐Ray Spectrometry,   Volume  12,   Issue  3,   1983,   Page  91-91

Ron Jenkins,  

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2. The surface geometrical structure effect in x‐ray fluorescence analysis of metallic samples
  X‐Ray Spectrometry,   Volume  12,   Issue  3,   1983,   Page  92-96

Wiesław Stankiewicz,   Andrzej Fudal,   Mirosława Wójtowicz,  

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3. A detailed evaluation of counting losses of detectors in wavelength‐dispersion x‐ray spectroscopy
  X‐Ray Spectrometry,   Volume  12,   Issue  3,   1983,   Page  97-105

Prabuddha Banerjee,  

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4. Real time chemical analysis of phosphoric acid using energy dispersive x‐ray fluorescence
  X‐Ray Spectrometry,   Volume  12,   Issue  3,   1983,   Page  106-110

Dean C. Marvin,   Neil A. Ives,  

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5. Automated matrix‐correction of line ratios in energy‐dispersive x‐ray fluorescence spectrum deconvolution
  X‐Ray Spectrometry,   Volume  12,   Issue  3,   1983,   Page  111-114

P. Van Dyck,   R. Van Grieken,  

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6. Fabrication and use of permanent monitors and standards
  X‐Ray Spectrometry,   Volume  12,   Issue  3,   1983,   Page  115-117

Michel Forté,  

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7. XRF analysis of trace titanium in coal using fundamental parameters
  X‐Ray Spectrometry,   Volume  12,   Issue  3,   1983,   Page  118-120

M. F. Garbauskas,   J. Wong,  

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8. A study of mathematical models for XRF spectrometry analysis of copper mattes and slags
  X‐Ray Spectrometry,   Volume  12,   Issue  3,   1983,   Page  121-127

Bret W. Budesinsky,  

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9. X‐ray spectroscopic studies of copper compounds and complexes in aqueous solution and polycrystalline form
  X‐Ray Spectrometry,   Volume  12,   Issue  3,   1983,   Page  128-131

P. N. Koul,   B. D. Padalia,  

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10. Call for papers
  X‐Ray Spectrometry,   Volume  12,   Issue  3,   1983,   Page  132-132

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