X‐Ray Spectrometry


ISSN: 0049-8246        年代:1985
当前卷期:Volume 14  issue 2     [ 查看所有卷期 ]

年代:1985
 
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1. Editorial
  X‐Ray Spectrometry,   Volume  14,   Issue  2,   1985,   Page  49-49

Ron Jenkins,  

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2. Evaluation of interelement coefficients by the fundamental parameter method in alloy analysis by XRF
  X‐Ray Spectrometry,   Volume  14,   Issue  2,   1985,   Page  50-52

Ivica Orlić,   J. Makjanić,   V. Valković,  

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3. X‐ray fluorescence determination of light rare earth elements, Y and Th, by the fusion technique
  X‐Ray Spectrometry,   Volume  14,   Issue  2,   1985,   Page  53-55

V. Macháček,   D. Weiss,  

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4. Some experience in using the MECA‐10‐44 (XR‐500) x‐ray fluorescence analyser for solving geological problems
  X‐Ray Spectrometry,   Volume  14,   Issue  2,   1985,   Page  56-61

E. M. Margolin,   Yu. I. Pronin,   D. Ya. Choporov,   A. M. Shil'nikov,   N. I. Komyak,   D. A. Goganov,   A. S. Serebryakov,   E. A. Fed'kov,  

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5. Depth profiling of brass by means of PIXE
  X‐Ray Spectrometry,   Volume  14,   Issue  2,   1985,   Page  62-68

V. Rössiger,   M. Lenk,  

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6. Analyses of barytes by x‐ray fluorescence spectrometry using a fusion method for sample preparation
  X‐Ray Spectrometry,   Volume  14,   Issue  2,   1985,   Page  69-73

D. Joslin,   P. D. Salt,  

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7. X‐ray mapping using a new coded irradiation technique
  X‐Ray Spectrometry,   Volume  14,   Issue  2,   1985,   Page  74-83

N. Gurker,  

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8. Quantitative electron microprobe determination of oxygen in metal layers covered by surface oxide films
  X‐Ray Spectrometry,   Volume  14,   Issue  2,   1985,   Page  84-88

P. Willich,   D. Obertop,   H. J. Tolle,  

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9. Concentration mapping—a software package for the quantitative determination of two‐dimensional elemental distribution by an electron probe microanalyser
  X‐Ray Spectrometry,   Volume  14,   Issue  2,   1985,   Page  89-98

M. Mayr,   J. Angeli,  

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10. Forthcoming meetings&conferences
  X‐Ray Spectrometry,   Volume  14,   Issue  2,   1985,   Page  99-99

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