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1. |
Editorial |
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X‐Ray Spectrometry,
Volume 14,
Issue 2,
1985,
Page 49-49
Ron Jenkins,
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ISSN:0049-8246
DOI:10.1002/xrs.1300140202
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1985
数据来源: WILEY
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2. |
Evaluation of interelement coefficients by the fundamental parameter method in alloy analysis by XRF |
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X‐Ray Spectrometry,
Volume 14,
Issue 2,
1985,
Page 50-52
Ivica Orlić,
J. Makjanić,
V. Valković,
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PDF (255KB)
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摘要:
AbstractA method for the calculation of interelement ‘empirical’ coefficients through the fundamental parameters method has been developed. The results of standard alloy analyses obtained in this way confirm the validity of this appro
ISSN:0049-8246
DOI:10.1002/xrs.1300140203
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1985
数据来源: WILEY
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3. |
X‐ray fluorescence determination of light rare earth elements, Y and Th, by the fusion technique |
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X‐Ray Spectrometry,
Volume 14,
Issue 2,
1985,
Page 53-55
V. Macháček,
D. Weiss,
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PDF (248KB)
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摘要:
AbstractA method for the determination of rare earth elements, Y and Th in raw materials with different matrices is described. The sample is fused with Li2B4O7and Cr and Mo are added as internal standards. Single elements can be determined in a wide range of concentrations, viz. Ce, Nd, La and Pr from 0.02 to 25% and Sm, Gd, Y, Th and Eu from 0.005 to 1%. The use of the LiF (110) crystal and, possibly, chemical separation, reduces the coincidence of lines to a minimum. Mutual interaction between single elements is prevented by the application of empirical corrections.
ISSN:0049-8246
DOI:10.1002/xrs.1300140204
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1985
数据来源: WILEY
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4. |
Some experience in using the MECA‐10‐44 (XR‐500) x‐ray fluorescence analyser for solving geological problems |
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X‐Ray Spectrometry,
Volume 14,
Issue 2,
1985,
Page 56-61
E. M. Margolin,
Yu. I. Pronin,
D. Ya. Choporov,
A. M. Shil'nikov,
N. I. Komyak,
D. A. Goganov,
A. S. Serebryakov,
E. A. Fed'kov,
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PDF (666KB)
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摘要:
AbstractThe excitation conditions have been studied and the accuracy and sensitivity estimated of the MECA‐10‐44 energy‐dispersive x‐ray fluorescence spectrometer, in the determination of contents of 10 major and 25–30 rare and scattered elements in samples of rocks and ores. The use of the instrument for the rapid routine analysis of geological samples for separate groups of elements has been demonstrated; when carrying out combined geochemical investigations, such an instrument represents an essential link in the system of analytical methods applied for complete elemental composition
ISSN:0049-8246
DOI:10.1002/xrs.1300140205
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1985
数据来源: WILEY
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5. |
Depth profiling of brass by means of PIXE |
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X‐Ray Spectrometry,
Volume 14,
Issue 2,
1985,
Page 62-68
V. Rössiger,
M. Lenk,
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PDF (620KB)
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摘要:
AbstractThe PIXE (particle‐induced x‐ray emission) depth profiling technique was applied to brass coatings on steel wire. Applying protons with energiesE0= 100–360 keV from a small electrostatic accelerator, the surface region to a depth of up to about 1 μm can be investigated. Three, or at maximum four, parameters of a suitable model function for the concentration profile were evaluated by analysing the ratio of Cu Kα and Zn Kα experimental x‐ray yields as a function of the primary energy of the
ISSN:0049-8246
DOI:10.1002/xrs.1300140206
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1985
数据来源: WILEY
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6. |
Analyses of barytes by x‐ray fluorescence spectrometry using a fusion method for sample preparation |
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X‐Ray Spectrometry,
Volume 14,
Issue 2,
1985,
Page 69-73
D. Joslin,
P. D. Salt,
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摘要:
AbstractVariation in the composition of commercial sources of barytes (BaSO4) govern its suitability for use in the oilwell drilling industry to control the density of the circulating drilling fluid. A fusion method of sample preparation using GeO2as a glass‐forming additive has been developed, enabling a 1 part sample to 4.1 parts ‘flux’ composition glass disc to be made for XRF ana
ISSN:0049-8246
DOI:10.1002/xrs.1300140207
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1985
数据来源: WILEY
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7. |
X‐ray mapping using a new coded irradiation technique |
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X‐Ray Spectrometry,
Volume 14,
Issue 2,
1985,
Page 74-83
N. Gurker,
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PDF (2995KB)
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摘要:
AbstractX‐ray imaging for physical analysis (elemental mapping) using ‘point’‐scanning methods suffers from long scanning times and low signal‐to‐noise ratios owing to the absence of proper focusing elements. A possible solution to this problem is to increase the interaction area (volume) for a single data acquisition step (‘line’ and ‘area’ scanning) and the use of suitable data to image transformation methods. Since in the past line scanning has been used (image reconstruction from projections), a new scanning concept (mask scanning, ‘coded irradiation’) is now introduced, which is related to coded aperture techniques. The principles, computer simulations and first experimenta
ISSN:0049-8246
DOI:10.1002/xrs.1300140208
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1985
数据来源: WILEY
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8. |
Quantitative electron microprobe determination of oxygen in metal layers covered by surface oxide films |
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X‐Ray Spectrometry,
Volume 14,
Issue 2,
1985,
Page 84-88
P. Willich,
D. Obertop,
H. J. Tolle,
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PDF (430KB)
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摘要:
AbstractA special electron microprobe data reduction procedure permits the determination of oxygen in vacuum‐deposited metal layers independent of the surface oxide layer, the mass thickness of which is simultaneously calculated. The method combines measurements of O Kα x‐rays at two values of the primary electron energy in the range 5–12.5 keV, which correspond to different depth distributions of x‐ray production. The measured data are evaluated by calibration curves derived from Gaussian Φ(ρz) depth distribution functions. Test analyses have been performed on amorphous metal layers with thicknesses of 0.5–1.5 μm. Typical concentrations of incorporated oxygen found ranged from 0.1 to 5 wt‐%. The influences of surface oxide films with mass thicknesses of 1–30 μg cm−2were studied by annealing experiments in agreement with the results derived from oxygen depth profiles measured by secondary i
ISSN:0049-8246
DOI:10.1002/xrs.1300140209
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1985
数据来源: WILEY
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9. |
Concentration mapping—a software package for the quantitative determination of two‐dimensional elemental distribution by an electron probe microanalyser |
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X‐Ray Spectrometry,
Volume 14,
Issue 2,
1985,
Page 89-98
M. Mayr,
J. Angeli,
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PDF (2286KB)
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摘要:
AbstractDevelopments starting from known digital mapping techniques led to a powerful and versatile software package, Concentration Mapping (CM), the advantages of which over former programs are as follows: up to 18 elements can be measured; correction calculations can be applied to obtain quantitative results; additional information may be obtained by further data processing; several programs for special data readout, phase analysis and statistical calculations are available; a very efficient automation system makes extended investigations practicable in an economical manner. Some examples of applications are given to demonstrate the extensive information from CM investigations which could not be achieved easily with customary electron probe microanalysis systems.
ISSN:0049-8246
DOI:10.1002/xrs.1300140210
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1985
数据来源: WILEY
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10. |
Forthcoming meetings&conferences |
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X‐Ray Spectrometry,
Volume 14,
Issue 2,
1985,
Page 99-99
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PDF (60KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300140211
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1985
数据来源: WILEY
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