X‐Ray Spectrometry


ISSN: 0049-8246        年代:1990
当前卷期:Volume 19  issue 3     [ 查看所有卷期 ]

年代:1990
 
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1. From the editor
  X‐Ray Spectrometry,   Volume  19,   Issue  3,   1990,   Page  91-91

John Gilfrich,  

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2. Absolute x‐ray fluorescence method for the determination of metal thicknesses by intensity ratio measurements
  X‐Ray Spectrometry,   Volume  19,   Issue  3,   1990,   Page  93-96

C. Vazquez,   D. V. De Leyt,   J. A. Riveros,  

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3. Two simple, practical correction procedures for spectra processing in energy‐dispersive x‐ray spectrometry
  X‐Ray Spectrometry,   Volume  19,   Issue  3,   1990,   Page  97-103

F. Eggert,  

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4. X‐ray emission studies on the (La1 − xBax)2CuO4 ± ysystem
  X‐Ray Spectrometry,   Volume  19,   Issue  3,   1990,   Page  105-111

B. S. Acharya,   Rajeev,   J. Muralidhar,  

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5. A PIXE data reduction code utilizing an IBM PC
  X‐Ray Spectrometry,   Volume  19,   Issue  3,   1990,   Page  113-116

A. B. Hallak,   M. M. Al‐Kofahi,   H. A. Al‐Juwair,  

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6. Versatile and accurate trace element determinations in iron‐rich and other geological samples using x‐ray fluorescence analysis
  X‐Ray Spectrometry,   Volume  19,   Issue  3,   1990,   Page  117-123

Ian W. Croudace,   Jon M. Gilligan,  

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7. Coordination state research in glasses by XRF
  X‐Ray Spectrometry,   Volume  19,   Issue  3,   1990,   Page  125-127

Li Xiaoding,  

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8. Use of the DuMond arrangement in analytical x‐ray spectrometers
  X‐Ray Spectrometry,   Volume  19,   Issue  3,   1990,   Page  129-132

B. S. Verman,   I. V. Serikov,  

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9. Analysis of NBS and other reference materials for testing the validity of the α‐parameter correction method in pixe
  X‐Ray Spectrometry,   Volume  19,   Issue  3,   1990,   Page  133-140

P. Aloupogiannis,   G. Robaye,   G. Weber,   J. M. Delbrouck‐Habaru,   I. Roelandts,  

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10. Use of theoretical accurate binary influence coefficients with Tertian's equation in x‐ray fluorescence analysis of silicate rocks in borax glass beads
  X‐Ray Spectrometry,   Volume  19,   Issue  3,   1990,   Page  141-144

L. M. Muia,   R. Van Grieken,  

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