X‐Ray Spectrometry


ISSN: 0049-8246        年代:1980
当前卷期:Volume 9  issue 3     [ 查看所有卷期 ]

年代:1980
 
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1. Editorial
  X‐Ray Spectrometry,   Volume  9,   Issue  3,   1980,   Page  95-95

Ron Jenkins,  

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2. The derivation of influence coefficients from experimental and calculated XRF data
  X‐Ray Spectrometry,   Volume  9,   Issue  3,   1980,   Page  96-100

G. T. Chamberlain,  

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3. The computer control of an electron probe microanalyser using camac and coral‐66
  X‐Ray Spectrometry,   Volume  9,   Issue  3,   1980,   Page  101-109

N. Swindells,  

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4. Computer control of the electron probe microanalyser: The control system and some applications
  X‐Ray Spectrometry,   Volume  9,   Issue  3,   1980,   Page  110-118

H. E. Bishop,   D. M. Poole,  

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5. The discrimination and classification of small fragments of window and non‐window glasses using energy‐dispersive x‐ray fluorescence spectrometry
  X‐Ray Spectrometry,   Volume  9,   Issue  3,   1980,   Page  119-122

R. J. Dudley,   C. R. Howden,   T. J. Taylor,   K. W. Smalldon,  

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6. A method for isotope‐excited X‐ray fluorescence analysis of thick samples
  X‐Ray Spectrometry,   Volume  9,   Issue  3,   1980,   Page  123-125

S. Datta,   S. Sadasivan,  

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7. An in‐depth study of energy‐dispersive x‐ray spectra
  X‐Ray Spectrometry,   Volume  9,   Issue  3,   1980,   Page  126-133

P. Van Espen,   H. Nullens,   F. Adams,  

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8. Zur quantitativen mikrosondenanalyse von geologischen proben mittels kombiniertem EDS/WDS
  X‐Ray Spectrometry,   Volume  9,   Issue  3,   1980,   Page  134-137

H. Schwander,   F. Gloor,  

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9. X‐ray fluorescence analysis without standards of small particles extracted from super‐alloys
  X‐Ray Spectrometry,   Volume  9,   Issue  3,   1980,   Page  138-142

Katsumi Ohno,   Jun Fujiwara,   Ichiro Morimoto,  

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10. The influence of tube voltage rectification in X‐ray fluorescence analysis without standards
  X‐Ray Spectrometry,   Volume  9,   Issue  3,   1980,   Page  143-145

M. Mantler,  

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