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1. |
Editorial |
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X‐Ray Spectrometry,
Volume 16,
Issue 6,
1987,
Page 235-235
John V. Gilfrich,
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ISSN:0049-8246
DOI:10.1002/xrs.1300160602
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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2. |
Ice thickness and low‐energy Si(Li) detector efficiency measurements |
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X‐Ray Spectrometry,
Volume 16,
Issue 6,
1987,
Page 237-241
David D. Cohen,
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PDF (435KB)
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摘要:
AbstractA simple technique for measuring the thickness of ice build‐up on the front face of Si(Li) detectors is described. This ice thickness varies with time and significantly modifies the low‐energy efficiency of Si(Li) detectors in the 1–5 keV energy range. We also report on the branching ratios for the ten resolvable neptunium M shell X‐ray lines from thin241Am α
ISSN:0049-8246
DOI:10.1002/xrs.1300160603
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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3. |
Assessment of the gaussian ϕ(ρz) curves in quantitative electron probe microanalysis without optimization of the parameters |
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X‐Ray Spectrometry,
Volume 16,
Issue 6,
1987,
Page 243-248
J. H. Tirira Saá,
M. A. Del Giorgio,
J. A. Riveros,
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PDF (483KB)
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摘要:
AbstractA new expression for the parameter β of the ϕ(ρz) curves is developed and the calculatedKintensity ratios are compared with the corresponding experimentalK, compiled in previous publications. The results show a mean value forK/Kof 1.003, a standard deviation of 4.8% and an asymmetry of 1.01 with respect to uni
ISSN:0049-8246
DOI:10.1002/xrs.1300160604
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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4. |
Evaluation of the main atomic number, absorption and fluorescence correction models in quantitative microanalysis |
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X‐Ray Spectrometry,
Volume 16,
Issue 6,
1987,
Page 249-254
D. Ugarte,
G. Castellano,
J. Trincaveli,
M. Del Giorgio,
J. A. Riveros,
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PDF (502KB)
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摘要:
AbstractThe principalLAFcorrection models have been tested for a set of 471 experimental values from heavy element binary specimens (Z>12) and another set of 116 determinations for oxides, both compiled by Loveet al. New fluorescence correction models have been developed, based on a Gaussian distribution of ionizations. The atomic number, absorption and fluorescence correction models corresponding to this distribution are the best fitting ones.
ISSN:0049-8246
DOI:10.1002/xrs.1300160605
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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5. |
Problems of automatic qualitative X‐ray fluorescence analysis: Part one |
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X‐Ray Spectrometry,
Volume 16,
Issue 6,
1987,
Page 255-259
J. U. Jordanov,
T. S. Tsanov,
R. Stefanov,
N. Jordanov,
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PDF (436KB)
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摘要:
AbstractThe first three stages of the automatic qualitative X‐ray fluorescence analysis: scanning of the spectrum, smoothing of the spectrum and approximation of the background are described. Considerations about optimal smoothing of the spectrum are presented using the different features of analytical lines and noise. A function well approximating the background intensity in dependence on the wavelength is found, and a method for background construction from the minima in the spectrum is discusse
ISSN:0049-8246
DOI:10.1002/xrs.1300160606
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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6. |
The Claisse–Quintin and Lachance–Claisse alpha correction algorithms and their modifications. A critical examination |
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X‐Ray Spectrometry,
Volume 16,
Issue 6,
1987,
Page 261-266
R. Tertian,
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摘要:
AbstractA slow progress has led us from a reduced formulation (Claisse—Quintin) to a perfected one combining: (1) an advanced knowledge (Tertian and co‐workers, Lachance) of the properties of binary influence coefficients; and (2) Tertian's equation for the resultant third element effect in any multi‐element system. The new algorithm is accurate and compares easily with typical fundamental parameter approaches (Criss and co‐workers) or fundamental coefficient approaches (Broll and Tertian, Rousseau). It suffers from the same reservations as regards possible deviations between theoretical assumptions and experimental reality. A refined experimental study of suitable binary standards should help to reduce these uncert
ISSN:0049-8246
DOI:10.1002/xrs.1300160607
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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7. |
Product news |
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X‐Ray Spectrometry,
Volume 16,
Issue 6,
1987,
Page 267-267
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PDF (76KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300160610
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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8. |
Masthead |
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X‐Ray Spectrometry,
Volume 16,
Issue 6,
1987,
Page -
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PDF (80KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300160601
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1987
数据来源: WILEY
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