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1. |
Conference reports |
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X‐Ray Spectrometry,
Volume 2,
Issue 2,
1973,
Page 7-8
J. F. Croke,
R. G. Westberg,
G. L. Hendry,
P. W. Hurley,
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ISSN:0049-8246
DOI:10.1002/xrs.1300020211
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1973
数据来源: WILEY
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2. |
Forthcoming conferences and mettings |
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X‐Ray Spectrometry,
Volume 2,
Issue 2,
1973,
Page 9-9
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PDF (52KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300020212
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1973
数据来源: WILEY
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3. |
News and events |
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X‐Ray Spectrometry,
Volume 2,
Issue 2,
1973,
Page 10-14
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PDF (658KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300020213
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1973
数据来源: WILEY
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4. |
Editorial |
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X‐Ray Spectrometry,
Volume 2,
Issue 2,
1973,
Page 45-45
R. Jenkins,
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PDF (57KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300020202
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1973
数据来源: WILEY
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5. |
Scattered primary radiation as an internal standard in X‐ray emission spectrometry: Use in the analysis of copper metallurgical products |
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X‐Ray Spectrometry,
Volume 2,
Issue 2,
1973,
Page 47-55
N. H. Clark,
R. J. Mitchell,
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摘要:
AbstractThe use of scattered primary X‐radiation of various wavelengths in the range 0.250 to 1.999 Å has been studied in the analysis of copper, iron, and silicon (as silica) in copper metallurgical products. In the analysis of copper and iron, the use of relatively short wavelength predominantly incoherently‐scattered radiation is superior to the use of background radiation near the analyte emission line, and it is necessary for the scatter wavelength to be shorter than that of a major absorption edge of a major element in the system. The wavelength 0.889 Å is suggested as the optimum for use in the analysis of copper, and one simple calibration equation provides acceptable analysis over the whole range ofCCufrom 0 to 42%. Over short ranges wavelengths from 0.362 to 0.889 Å are useful in the analysis of iron; but one single calibration cannot be devised to cover the whole range ofCFefrom 0 to 56%. The limited results for silicon as silica are included for comple
ISSN:0049-8246
DOI:10.1002/xrs.1300020203
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1973
数据来源: WILEY
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6. |
X‐ray spectrometric determination of major elements in silicate rock samples, using a thin film technique based on ion exchange dissolution |
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X‐Ray Spectrometry,
Volume 2,
Issue 2,
1973,
Page 57-62
K. Govindaraju,
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摘要:
AbstractA new method of sample preparation with a very high sample dilution range of about 1:70 is proposed for X‐ray spectrometric determination of major elements in silicate rock samples. In spite of this large dilution, sensitivity is not sacrificed as the sample, uniformly distributed in an ion exchange resin (i.e. a light organic matrix), is presented for analysis in a small volume (thin film technique). The fusion product of the sample with lithium borate (40% of sample, 60% of flux) is dissolved by thorough mixing in an aqueous suspension of a strong acid cation exchange resin. During the cation exchange dissolution, the cations originally present in the rock sample are transferred quantitatively and homogeneously onto the resin. The dried resin is then sprinkled uniformly on a plastic adhesive strip in such a way that a single layer of resin beads (about 100 μm) is obtained. The impregnated strip is then analysed, with a counting time of 20 s for all elements except for Mg (100 s).The analysis of several geochemical standards for Al2O3, Fe2O3, MgO, CaO, TiO2and K2O shows the practical absence of matrix effects. Furthermore, a working curve could be constructed for each element as a straight line between a high standard and a blank sample (0%), the latter consisting simply of pure dry cation exchange resin in H+form. As only 90 to 100 mg amounts of resin beads are necessary for making a thin film (diameter 4 cm), microanalysis with 5 to 10 mg of mineral or rock samples also becomes possib
ISSN:0049-8246
DOI:10.1002/xrs.1300020204
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1973
数据来源: WILEY
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7. |
On‐stream energy dispersive X‐ray analysers |
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X‐Ray Spectrometry,
Volume 2,
Issue 2,
1973,
Page 63-67
K. G. Carr‐Brion,
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PDF (567KB)
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摘要:
AbstractThe advantages and disadvantages of on‐stream energy dispersive analysers for X‐ray fluorescence and diffraction have been examined. These include factors such as ease of sample presentation, selection of exciting X‐ray energy, stability, count rate performance and microphony. Finally a number of applications and feasibility studies have been described including work for the cement, mineral processing, extractive metallurgy and related indus
ISSN:0049-8246
DOI:10.1002/xrs.1300020205
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1973
数据来源: WILEY
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8. |
Quantitative electron microprobe analysis using a lithium drifted silicon detector |
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X‐Ray Spectrometry,
Volume 2,
Issue 2,
1973,
Page 69-74
S. J. B. Reed,
N. G. Ware,
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PDF (559KB)
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摘要:
AbstractPulse pile‐up, dead time, escape peaks, background, and peak overlap in Si(Li) spectra are discussed in relation to microprobe analysis, and procedures for carrying out the necessary corrections for quantitative analysis of elements of atomic number 11 to 30 are described. The accuracy is generally comparable with that obtained with crystal spectrometers, though the limit of detection (about 0.1%) is highe
ISSN:0049-8246
DOI:10.1002/xrs.1300020206
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1973
数据来源: WILEY
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9. |
A simple calculation model with great versatility for interelement effects in steel by X‐ray fluorescence analysis |
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X‐Ray Spectrometry,
Volume 2,
Issue 2,
1973,
Page 75-83
M. Dahl,
A. Karlsson,
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摘要:
AbstractDemands of more rapid and accurate answers for the steel plant made it necessary to develop a computerized system for calculation and control of the analysis performed on X‐ray fluorescence and optical emission spectrometers. The interelement effects which occur in X‐ray fluorescence analysis are briefly described and the evolution of a model for these corrections is examined. This model includes corrections for absorption and secondary fluorescence as well as overlapping, dead time effects, etc. which are based on simplified theoretical formulae and can be used for a broad field of applications. The parameters in the model have been determined empirically by measuring a wide range of binary alloys. The interelement effects in optical emission analysis are calculated according to a simple emprical formula. The mathematical models have been fitted to a computer (Datasystem Trask P100) which also controls the two separate spectrometers. Examples are given of routine analysis performed by this model on bulk solids of steels and fused glassy borates of sinters, slags and hard metals. Its chief advantage is that the usual requirement for a great number of standards is elimina
ISSN:0049-8246
DOI:10.1002/xrs.1300020207
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1973
数据来源: WILEY
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10. |
High intensity excitation sources for X‐ray energy spectroscopy |
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X‐Ray Spectrometry,
Volume 2,
Issue 2,
1973,
Page 85-89
D. E. Porter,
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摘要:
AbstractThe use of secondary targets with commercially available high power X‐ray spectroscopy tubes has been investigated as a means of providing an excitation source for X‐ray energy spectroscopy. A comparison has been made between the secondary target mode of excitation and the use of the tube directly. Results from this comparison show the superiority of the secondary target technique. Examples of analysis using the secondary target excitation are given to illustrate the high data rates and low background this technique has to of
ISSN:0049-8246
DOI:10.1002/xrs.1300020208
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1973
数据来源: WILEY
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