ISSN:0049-8246    

DOI:10.1002/xrs.1300200502

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

摘要:

AbstractThe possibilities of carrying out x‐ray microfluorescence analysis are reviewed. The main approaches are converting the electron optical column of an electron microscope into a transmission x‐ray tube, using microfocusing x‐ray tubes, combining x‐ray tubes with capillary techniques, combining x‐ray tubes with monochromators and applying synchrotron

ISSN:0049-8246    

DOI:10.1002/xrs.1300200503

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

摘要:

AbstractThe use of Fe–Mn–Al–C alloys in oxidizing–sulphidizing environments at elevated temperatures is considered. Applications of SEM, EDX mapping and x‐ray diffraction techniques to the microstructural characterization of the scale development on these alloys are reviewed. Combination of the electron microscope and the analytical techniques provides information concerning the morphology, elemental distribution, crystal structure and identification of phases in the scale. This information is of particular importance in the design and development of a corrosion‐resistant alloy. Application of the above techniques is described with examples from oxidation studies in air and corrosion studies in SO2–O2gas mixtures with different sulphur part

ISSN:0049-8246    

DOI:10.1002/xrs.1300200504

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

摘要:

AbstractThe capabilities of delayed x‐ray spectrometry preceded by isotope‐source thermal neutron activation for the specific determination of some rare earth elements (Sm, Eu, Dy, Ho) in small powdered samples was evaluated. The feasibility study relied heavily on the low‐energy sensitivity of the detector used. Detection of the delayed x‐rays was achieved with a 100‐mm2Ge detector with the ability to produce optimum photopeak‐to‐noise ratios. The rare earth elements were chosen on the basis of their inherent favourable nuclear properties for producing a practicable x‐ray yield and on the demand for their analysis. Analytical results are presented over a range of concentrations for the elements of interest and the potential of the technique for application to their general routine analysis is discussed. Interferences from the sample matrix can be suppressed to an extent that makes the method almost independent of the matrix. This and other features make the technique a strong rival to conventional acti

ISSN:0049-8246    

DOI:10.1002/xrs.1300200505

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

摘要:

AbstractA mathematical model has been developed for the quantitative x‐ray fluorescence spectrometry of small spherical samples, e.g. targets containing diagnostic materials for inertial confinement fusion experiments. The model corrects for matrix effects in a multi‐layer spherical geometry much as existing programs now do for thin films or bulk samples. Attenuation effects have been found to be greater in a shell geometry than in a comparable thin‐film geometry because multiple passes through the shell are possible and because many paths in or out are nearly tangential to the shell. In both cases the path is longer and attenuation is greater. The model for primary fluorescence from uniform shells has also been extended to approximate the fluorescence from non‐uniform shells. This allows one to predict how experimental results would vary with sample mounting if excess material were oriented toward or away from the x‐ray beam or the detector or away from both. Finally, a simplified model for estimating the magnitude of secondary fluorescence effects is

ISSN:0049-8246    

DOI:10.1002/xrs.1300200506

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

摘要:

AbstractA wavelength‐dispersive x‐ray fluorescence method was developed for the determination of phosphorus in borophosphosilicate glass (BPSG) or phosphosilicate glass (PSG) films on a silicon wafer. Secondary spectral line intensities from the coated wafer are compared with those of an uncoated Si wafer and a fused P standard. The results are then converted to phosphorus content and surface density of the film by equations for the relative spectral line intensities of P and Si with corrections for the shift in the Si peak due to chemical bonding. Results obtained on an annealed set of PSG samples using four different incident spectra were self‐consistent and correlated well with independent inductively coupled plasma atomic emission spectrometric analyses for phosphorus and ellipsometric measurements of thickness. Preliminary results with BPSG samples were promising and showed that results for phosphorus were not sensitive to boron concentrations in the

ISSN:0049-8246    

DOI:10.1002/xrs.1300200507

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

ISSN:0049-8246    

DOI:10.1002/xrs.1300200508

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

ISSN:0049-8246    

DOI:10.1002/xrs.1300200509

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY

ISSN:0049-8246    

DOI:10.1002/xrs.1300200501

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1991

数据来源: WILEY