X‐Ray Spectrometry


ISSN: 0049-8246        年代:1994
当前卷期:Volume 23  issue 5     [ 查看所有卷期 ]

年代:1994
 
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1. From the Editor
  X‐Ray Spectrometry,   Volume  23,   Issue  5,   1994,   Page  193-193

John Gilfrich,  

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2. Analytical electron microscopy of thin segregated layers
  X‐Ray Spectrometry,   Volume  23,   Issue  5,   1994,   Page  195-202

R. G. Faulkner,   T. S. Morgan,   E. A. Little,  

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3. Submicrometer phase chemical composition analysis with an electron probe microanalyzer
  X‐Ray Spectrometry,   Volume  23,   Issue  5,   1994,   Page  203-207

Frank Cheng‐Yu Wang,  

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4. Ll, Lα, Lβ and Lγ X‐Ray Production Cross‐Sections in Elements 57 ≤Z≤ 92 by 8–50 ke V Photons
  X‐Ray Spectrometry,   Volume  23,   Issue  5,   1994,   Page  208-217

K. S. Mann,   N. Singh,   Raj Mittal,   B. S. Sood,   K. L. Allawadhi,  

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5. Chlorine determination in photographic developer solutions using wavelength‐dispersive X‐ray fluorescence
  X‐Ray Spectrometry,   Volume  23,   Issue  5,   1994,   Page  218-220

Mark A. Morse,  

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6. Calculation of photo‐ and auger electron contribution to X‐ray fluorescence excitation of elements with low atomic number
  X‐Ray Spectrometry,   Volume  23,   Issue  5,   1994,   Page  221-228

G. V. Pavlinsky,   A. Yu. Dukhanin,  

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7. Study on journal distribution of publications in the field of X‐ray fluorescence analysis
  X‐Ray Spectrometry,   Volume  23,   Issue  5,   1994,   Page  229-235

K. N. Stoev,  

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8. Electronic structure and L X‐ray emission spectra of molybdenum carbide, boride, nitride, silicide and silicocarbide
  X‐Ray Spectrometry,   Volume  23,   Issue  5,   1994,   Page  236-241

B. S. Acharya,   R. Sakthivel,  

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9. News
  X‐Ray Spectrometry,   Volume  23,   Issue  5,   1994,   Page  242-242

Peter A. Pella,  

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10. Forthcoming meetings and events
  X‐Ray Spectrometry,   Volume  23,   Issue  5,   1994,   Page  243-243

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