X‐Ray Spectrometry


ISSN: 0049-8246        年代:1983
当前卷期:Volume 12  issue 2     [ 查看所有卷期 ]

年代:1983
 
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1. Editorial
  X‐Ray Spectrometry,   Volume  12,   Issue  2,   1983,   Page  51-51

RON JENKINS,  

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2. The effect of elastically scattered protons on the energy resolution of x‐ray detectors in PIXE measurements
  X‐Ray Spectrometry,   Volume  12,   Issue  2,   1983,   Page  52-58

D. W. Mingay,  

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3. The accuracy and precision of routine energy‐dispersive electron microprobe analysis of serpentine
  X‐Ray Spectrometry,   Volume  12,   Issue  2,   1983,   Page  59-66

F. J. Wicks,   A. G. Plant,  

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4. A new source configuration for trace analysis of small samples by XRF
  X‐Ray Spectrometry,   Volume  12,   Issue  2,   1983,   Page  67-71

C. Shenberg,   M. Boazi,   M. S. Rapaport,  

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5. X‐ray fluorescence analysis with a linear polarized beam after bragg reflection from a flat or a curved single crystal
  X‐Ray Spectrometry,   Volume  12,   Issue  2,   1983,   Page  72-78

P. Wobrauschek,   H. Aiginger,  

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6. Determination of brass composition and plating thickness on brass‐plated wire and cord by x‐ray fluorescence spectrometry
  X‐Ray Spectrometry,   Volume  12,   Issue  2,   1983,   Page  79-81

J. L. Ponchon,   P. Bourrain,   A. Palsky,  

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7. Properties of intrinsic germanium detectors at low engergies by escape peak spectroscopy
  X‐Ray Spectrometry,   Volume  12,   Issue  2,   1983,   Page  82-86

B. Rosner,   D. W. Mingay,  

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8. Application of the linear relationship between the reciprocal of analyte‐line intensity and the reciprocal of concentration to the analysis of geological materials
  X‐Ray Spectrometry,   Volume  12,   Issue  2,   1983,   Page  87-90

Chung‐Hsi Huang,   T. E. Smith,  

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9. Product news
  X‐Ray Spectrometry,   Volume  12,   Issue  2,   1983,   Page  -

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