X‐Ray Spectrometry


ISSN: 0049-8246        年代:1988
当前卷期:Volume 17  issue 5     [ 查看所有卷期 ]

年代:1988
 
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1. Editorial
  X‐Ray Spectrometry,   Volume  17,   Issue  5,   1988,   Page  169-169

John V. Gilfrich,  

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2. Quantitative trace element determination in thin samples by total reflection x‐ray fluorescence using the scattered radiation method
  X‐Ray Spectrometry,   Volume  17,   Issue  5,   1988,   Page  171-174

C. T. Yap,   R. E. Ayala,   P. Wobrauschek,  

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3. X‐Ray spectrometric determination of minor element contents in stainless steels
  X‐Ray Spectrometry,   Volume  17,   Issue  5,   1988,   Page  175-179

A. N. Smagunova,   E. I. Molchanova,   L. N. Pliner,   A. L. Finkelshtein,  

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4. Structural studies on heat‐treated pyrophyllite mineral by scanning electron microscopy
  X‐Ray Spectrometry,   Volume  17,   Issue  5,   1988,   Page  181-185

S. S. Amritphale,   M. Patel,  

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5. Studies on the variation of cell dimensions of mullite with iron oxide and titania additions
  X‐Ray Spectrometry,   Volume  17,   Issue  5,   1988,   Page  187-188

P. Das,   R. Choudhury,  

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6. Shape and extended fine structure of the x‐ray K‐absorption discontinuity in some cobalt mixed‐ligand complexes
  X‐Ray Spectrometry,   Volume  17,   Issue  5,   1988,   Page  189-193

Padmakar V. Khadikar,  

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7. Determination of some trace elements in high‐purity tantalum metal by thin‐film x‐ray fluorescence spectrometry
  X‐Ray Spectrometry,   Volume  17,   Issue  5,   1988,   Page  195-199

B. T. Eddy,   A. M. E. Balaes,  

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8. Investigations towards optimizing EDS analysis by the Cliff‐Lorimer method in scanning transmission electron microscopy
  X‐Ray Spectrometry,   Volume  17,   Issue  5,   1988,   Page  201-208

H. Hoeft,   P. Schwaab,  

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9. Masthead
  X‐Ray Spectrometry,   Volume  17,   Issue  5,   1988,   Page  -

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