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1. |
Editorial |
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X‐Ray Spectrometry,
Volume 17,
Issue 5,
1988,
Page 169-169
John V. Gilfrich,
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ISSN:0049-8246
DOI:10.1002/xrs.1300170502
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1988
数据来源: WILEY
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2. |
Quantitative trace element determination in thin samples by total reflection x‐ray fluorescence using the scattered radiation method |
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X‐Ray Spectrometry,
Volume 17,
Issue 5,
1988,
Page 171-174
C. T. Yap,
R. E. Ayala,
P. Wobrauschek,
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摘要:
AbstractIt is shown that samples exposed under total reflection conditions obey the relationshipIi/Iinc=KCi, whereIiis the x‐ray fluorescence intensity due to elementiof concentrationCi,Iincis the intensity of the scattered incoherent radiation andKis a constant. An experiment on the determination of sulphur in diesel fuel confirmed this derivation. This relationship affords a simple and fast method for quantitative trace element determination, requiring virtually no sample preparation and extremely small amounts (
ISSN:0049-8246
DOI:10.1002/xrs.1300170503
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1988
数据来源: WILEY
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3. |
X‐Ray spectrometric determination of minor element contents in stainless steels |
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X‐Ray Spectrometry,
Volume 17,
Issue 5,
1988,
Page 175-179
A. N. Smagunova,
E. I. Molchanova,
L. N. Pliner,
A. L. Finkelshtein,
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PDF (443KB)
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摘要:
AbstractModels of the dependence of the background intensity on the chemical composition of a specimen for different conditions of analysis are presented. On the basis of these models, a new technique for background correction in the x‐ray spectrometry of homogeneous materials with widely varying composition is suggested. Criteria for evaluation of the necessity for background correction are discusse
ISSN:0049-8246
DOI:10.1002/xrs.1300170504
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1988
数据来源: WILEY
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4. |
Structural studies on heat‐treated pyrophyllite mineral by scanning electron microscopy |
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X‐Ray Spectrometry,
Volume 17,
Issue 5,
1988,
Page 181-185
S. S. Amritphale,
M. Patel,
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PDF (517KB)
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摘要:
AbstractPyrophyllite was heat treated up to 1000°C in the presence of fluxes such as Li2CO3, Na2CO3, K2CO3and CaCO3and the products were examined by scanning electron microscopy (SEM). It is shown that the surface morphology of the mineral varies with both temperature and flux. The dehydroxylation reaction in the mineral commences at 500°C and continues above 900°C. Dehydroxylated phases are observed even at 950‐1000°C. The formation of free Al2O3, cristobalite, mullite and other phases from pyrophyllite was detected by the SEM examin
ISSN:0049-8246
DOI:10.1002/xrs.1300170505
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1988
数据来源: WILEY
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5. |
Studies on the variation of cell dimensions of mullite with iron oxide and titania additions |
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X‐Ray Spectrometry,
Volume 17,
Issue 5,
1988,
Page 187-188
P. Das,
R. Choudhury,
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摘要:
AbstractAn analysis has been made of Cameron's data on the variation of the cell dimensions of mullite for compositions with additions of more than 1.0% of Fe + Ti for samples crystallizing out of the melt phase. It was observed that, depending on the amount of either iron oxide or titania added, the cell dimensions change with respect to changes in cell volume, exhibiting shrinkage along either theborccell edges. Increasing amounts of titania appear to influence theccell edge in preference to theaandbedges. The overall cell symmetry, however, is preserved with a simultaneous increase in theacell edge with change in the cell volume.
ISSN:0049-8246
DOI:10.1002/xrs.1300170506
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1988
数据来源: WILEY
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6. |
Shape and extended fine structure of the x‐ray K‐absorption discontinuity in some cobalt mixed‐ligand complexes |
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X‐Ray Spectrometry,
Volume 17,
Issue 5,
1988,
Page 189-193
Padmakar V. Khadikar,
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摘要:
AbstractCorrelation of the variation in the distance between cobalt ions and its nearest neighbours with the variation in the covalency of the metal—ligand bond was estimated from the shape and the extended fine structure of cobalt K‐absorption discontinuity in some cobalt mixed‐ligand comp
ISSN:0049-8246
DOI:10.1002/xrs.1300170507
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1988
数据来源: WILEY
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7. |
Determination of some trace elements in high‐purity tantalum metal by thin‐film x‐ray fluorescence spectrometry |
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X‐Ray Spectrometry,
Volume 17,
Issue 5,
1988,
Page 195-199
B. T. Eddy,
A. M. E. Balaes,
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摘要:
AbstractThe determination of niobium, molybdenum, tungsten, iron and titanium in tantalum metal is described. After dissolution of the metal and extraction of the tantalum by a chromatographic method using tributyl phosphate, the trace elements are determined on thin‐film samples by x‐ray fluorescence spectrometry. The thin‐film samples are prepared either by spotting the sample solutions directly on to filter‐paper or by coprecipitation with indium. The limits of detection on the thin film are 0.05–0.7 μg, depending on the element bein
ISSN:0049-8246
DOI:10.1002/xrs.1300170508
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1988
数据来源: WILEY
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8. |
Investigations towards optimizing EDS analysis by the Cliff‐Lorimer method in scanning transmission electron microscopy |
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X‐Ray Spectrometry,
Volume 17,
Issue 5,
1988,
Page 201-208
H. Hoeft,
P. Schwaab,
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PDF (650KB)
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摘要:
AbstractThe critical specimen thickness up to which the Cliff‐Lorimer method can be used without additional corrections was measured on some steels and nickel‐base alloys for soft x‐rays with line energies between 1 and 3 keV. The critical thickness values measured are 50 nm at 1 keV and 450 to 500 nm at 3 keV. These results indicated that verification of the calibration measurements used for determining the correction factors was necessary in the case of soft radiation. The measurements led to a further optimization of the parameters in the equation used for calculating the ionization cross‐sectionThe published equations for absorption correction, which becomes necessary when the critical specimen thickness is exceeded, were found to lead to an overcorrection in the case of very thin foils and an insufficient correction in the case of thicker specimens. However, it is only of significance if the specimens are very thick or errors less than 5% are ai
ISSN:0049-8246
DOI:10.1002/xrs.1300170509
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1988
数据来源: WILEY
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9. |
Masthead |
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X‐Ray Spectrometry,
Volume 17,
Issue 5,
1988,
Page -
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PDF (95KB)
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ISSN:0049-8246
DOI:10.1002/xrs.1300170501
出版商:Wiley Subscription Services, Inc., A Wiley Company
年代:1988
数据来源: WILEY
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