| 1. |
OPENING REMARKS |
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Annals of the New York Academy of Sciences,
Volume 306,
Issue 1,
1978,
Page 1-2
Donald F. Parsons,
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PDF (113KB)
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ISSN:0077-8923
DOI:10.1111/j.1749-6632.1978.tb25634.x
出版商:Blackwell Publishing Ltd
年代:1978
数据来源: WILEY
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| 2. |
RADIATION DAMAGE AND CHROMATIC ABERRATION PRODUCED BY INELASTIC SCATTERING OF ELECTRONS IN THE ELECTRON MICROSCOPE: STATEMENT OF THE PROBLEM |
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Annals of the New York Academy of Sciences,
Volume 306,
Issue 1,
1978,
Page 3-13
V. E. Cosslett,
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PDF (645KB)
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ISSN:0077-8923
DOI:10.1111/j.1749-6632.1978.tb25635.x
出版商:Blackwell Publishing Ltd
年代:1978
数据来源: WILEY
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| 3. |
A SURVEY OF DIFFERENT INELASTIC INTERACTIONS OF ELECTRONS WITH LIGHT ATOMS* |
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Annals of the New York Academy of Sciences,
Volume 306,
Issue 1,
1978,
Page 14-28
R. A. Bonham,
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PDF (755KB)
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ISSN:0077-8923
DOI:10.1111/j.1749-6632.1978.tb25636.x
出版商:Blackwell Publishing Ltd
年代:1978
数据来源: WILEY
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| 4. |
ELECTRON ENERGY LOSSES WITH SPECIAL REFERENCE TO HIGH‐VOLTAGE ELECTRON MICROSCOPY |
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Annals of the New York Academy of Sciences,
Volume 306,
Issue 1,
1978,
Page 29-46
B. Jouffrey,
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PDF (1443KB)
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ISSN:0077-8923
DOI:10.1111/j.1749-6632.1978.tb25637.x
出版商:Blackwell Publishing Ltd
年代:1978
数据来源: WILEY
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| 5. |
EFFECTS OF INELASTICALLY SCATTERED ELECTRONS IN VARIOUS CTEM AND STEM IMAGING MODES |
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Annals of the New York Academy of Sciences,
Volume 306,
Issue 1,
1978,
Page 47-61
H. Rose,
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PDF (860KB)
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ISSN:0077-8923
DOI:10.1111/j.1749-6632.1978.tb25638.x
出版商:Blackwell Publishing Ltd
年代:1978
数据来源: WILEY
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| 6. |
UTILIZATION OF INELASTIC SCATTER IN THE STEM MODE* |
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Annals of the New York Academy of Sciences,
Volume 306,
Issue 1,
1978,
Page 62-72
E. Zeitler,
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PDF (703KB)
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ISSN:0077-8923
DOI:10.1111/j.1749-6632.1978.tb25639.x
出版商:Blackwell Publishing Ltd
年代:1978
数据来源: WILEY
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| 7. |
A HIGH‐RESOLUTION AUGER ELECTRON MICROSCOPE USING FOIL LENSES |
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Annals of the New York Academy of Sciences,
Volume 306,
Issue 1,
1978,
Page 75-84
J. G. King,
J. W. Coleman,
E. H. Jacobsen,
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PDF (457KB)
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ISSN:0077-8923
DOI:10.1111/j.1749-6632.1978.tb25640.x
出版商:Blackwell Publishing Ltd
年代:1978
数据来源: WILEY
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| 8. |
PULSED ELECTRON BEAMS TO REDUCE RADIATION DAMAGE?* |
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Annals of the New York Academy of Sciences,
Volume 306,
Issue 1,
1978,
Page 85-94
R. A. Bonham,
R. E. Kennerly,
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PDF (470KB)
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ISSN:0077-8923
DOI:10.1111/j.1749-6632.1978.tb25641.x
出版商:Blackwell Publishing Ltd
年代:1978
数据来源: WILEY
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| 9. |
IMAGE ANALYSIS AND BEAM DAMAGE |
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Annals of the New York Academy of Sciences,
Volume 306,
Issue 1,
1978,
Page 95-111
R. E. Burge,
R. F. Scott,
J. Thorn,
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PDF (2703KB)
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ISSN:0077-8923
DOI:10.1111/j.1749-6632.1978.tb25642.x
出版商:Blackwell Publishing Ltd
年代:1978
数据来源: WILEY
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| 10. |
OPTIMAL USE OF IMAGE INFORMATION USING SIGNAL DETECTION AND AVERAGING TECHNIQUES |
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Annals of the New York Academy of Sciences,
Volume 306,
Issue 1,
1978,
Page 112-120
Joachim Frank,
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PDF (943KB)
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ISSN:0077-8923
DOI:10.1111/j.1749-6632.1978.tb25643.x
出版商:Blackwell Publishing Ltd
年代:1978
数据来源: WILEY
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