Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena


ISSN: 1071-1023        年代:1997
当前卷期:Volume 15  issue 5     [ 查看所有卷期 ]

年代:1997
 
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11. Possible multistranded DNA induced by acid denaturation–renaturation
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  5,   1997,   Page  1637-1640

Jian Wei Li,   Fang Tian,   Chen Wang,   Chun Li Bai,   En Hua Cao,  

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12. Scanning tunneling microscopy and low energy electron diffraction study of the formation of a∛×∛R30°reconstruction on the hydrogen etched Si(111)1×1surface
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  5,   1997,   Page  1641-1646

D. Rogers,   T. Tiedje,  

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13. Frequency modulation detection high vacuum scanning force microscope with a self-oscillating piezoelectric cantilever
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  5,   1997,   Page  1647-1651

Jiaru Chu,   Toshihiro Itoh,   Chengkuo Lee,   Tadatomo Suga,   Kazutoshi Watanabe,  

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14. Atomic force microscopy studies ofHg1−xCdxTethin films grown by isothermal vapor phase epitaxy
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  5,   1997,   Page  1652-1656

S. Di Nardo,   L. Lozzi,   S. Santucci,   S. Bernardi,  

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15. Ga focused-ion-beam shallow-implanted quantum wires
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  5,   1997,   Page  1657-1660

M. Itoh,   T. Saku,   Y. Hirayama,   S. Tarucha,  

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16. Improved cold electron emission characteristics of electroluminescent porous silicon diodes
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  5,   1997,   Page  1661-1665

Xia Sheng,   Hideki Koyama,   Nobuyoshi Koshida,   Shingo Iwasaki,   Nobuyasu Negishi,   Takashi Chuman,   Takamasa Yoshikawa,   Kiyohide Ogasawara,  

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17. Nanoprotrusion model for field emission from integrated microtips
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  5,   1997,   Page  1666-1677

S. T. Purcell,   Vu Thien Binh,   R. Baptist,  

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18. Electron emission from the pyramidal-shaped diamond after hydrogen and oxygen surface treatments
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  5,   1997,   Page  1678-1681

T. Yamada,   H. Ishihara,   K. Okano,   S. Koizumi,   J. Itoh,  

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19. Technique for fabricating self-aligned gates onto silicon field emitter arrays
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  5,   1997,   Page  1682-1684

Chang-Chun Zhu,   Hui Guan,   Weidong Liu,   Tian-Ying Li,   Johnny K. O. Sin,  

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20. Growth mechanism of planar-type GaAs nanowhiskers
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  5,   1997,   Page  1685-1687

K. Haraguchi,   K. Hiruma,   K. Hosomi,   M. Shirai,   T. Katsuyama,  

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