Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena


ISSN: 1071-1023        年代:1984
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年代:1984
 
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11. The oxidation of GaAs(110): A reevaluation
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  3,   1984,   Page  351-358

G. Landgren,   R. Ludeke,   Y. Jugnet,   J. F. Morar,   F. J. Himpsel,  

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12. Adsorption of H, O, and H2O at Si(100) and Si(111) surfaces in the monolayer range: A combined EELS, LEED, and XPS study
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  3,   1984,   Page  359-365

J. A. Schaefer,   F. Stucki,   D. J. Frankel,   W. Göpel,   G. J. Lapeyre,  

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13. The ZnSe(110) puzzle: Comparison with GaAs(110)
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  3,   1984,   Page  366-370

C. B. Duke,   A. Paton,   A. Kahn,   D‐W Tu,  

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14. New approach to thek⋅ ptheory of semiconductor superlattices
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  3,   1984,   Page  371-375

C. Mailhiot,   T. C. McGill,   D. L. Smith,  

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15. Binding energies of acceptors in GaAs–AlxGa1−xAs quantum wells
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  3,   1984,   Page  376-382

W. T. Masselink,   Yia‐Chung Chang,   H. Morkoç,  

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16. Summary Abstract: (110) surface geometry of GaAs
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  3,   1984,   Page  383-383

D. J. Chadi,  

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17. High resolution electron energy loss studies of Fermi level states of clean and metallized Si(111) surfaces
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  3,   1984,   Page  384-389

J. E. Demuth,   B. N. J. Persson,  

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18. Electronic states of the (100) (2×1) reconstructed Ge surface
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  3,   1984,   Page  390-392

David V. Froelich,   Marshall A. Bowen,   John D. Dow,  

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19. The geometric structures of the GaAs(111) and (110) surfaces
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  3,   1984,   Page  393-398

S. Y. Tong,   W. N. Mei,   G. Xu,  

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20. Summary Abstract: Total‐energy study of the vacancy model for the GaAs(111) surface
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  3,   1984,   Page  399-399

D. J. Chadi,  

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