Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena


ISSN: 1071-1023        年代:1984
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年代:1984
 
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11. The growth of epitaxial layers with an improved LPE apparatus
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  2,   1984,   Page  154-155

C. Heinz,   W. Schmidt auf Altenstadt,  

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12. Structural and optical properties of GaAs–AlxGa1−xAs quantum wells
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  2,   1984,   Page  163-166

K. Woodbridge,   P. Dawson,   J. P. Gowers,   C. T. Foxon,  

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13. Persistent photoconductivity in AlGaAs–GaAs heterostructures
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  2,   1984,   Page  167-169

M. I. Nathan,   M. Heiblum,   J. Klem,   H. Morkoç,  

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14. Improvement of the inverted GaAs/AlGaAs heterointerface
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  2,   1984,   Page  170-174

R. Fischer,   W. T. Masselink,   Y. L. Sun,   T. J. Drummond,   Y. C. Chang,   M. V. Klein,   H. Morkoç,   E. Anderson,  

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15. Summary Abstract: Electron overflow and interface state effect in MBE‐grown AlGaAs/GaAs MISS‐FET’s
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  2,   1984,   Page  175-175

Hiroyuki Sakaki,   Takashi Hotta,  

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16. InAsSb strained‐layer superlattices for long wavelength detector applications
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  2,   1984,   Page  176-178

G. C. Osbourn,  

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17. Summary Abstract: High qualityp–njunctions in InGaAs/GaAs strained‐layer superlattices
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  2,   1984,   Page  179-180

L. R. Dawson,   G. C. Osbourn,   T. E. Zipperian,   J. J. Wiczer,   C. E. Barnes,   I. J. Fritz,   R. M. Biefeld,  

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18. Effects of strain and layer thickness on the growth of InxGa1−xAs–GaAs strained‐layer superlattices
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  2,   1984,   Page  181-185

W. D. Laidig,   C. K. Peng,   Y. F. Lin,  

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19. Summary Abstract: The influence of growth conditions on sulfur and selenium incorporation in Ga1−xAlxAs grown by molecular beam epitaxy
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  2,   1984,   Page  186-187

G. J. Davies,   R. Heckingbottom,   D. A. Andrews,  

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20. The use of substrate annealing as a gettering technique prior to molecular beam epitaxial growth
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  2,   Issue  2,   1984,   Page  188-193

S. C. Palmateer,   L. F. Eastman,   A. R. Calawa,  

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