|
151. |
Investigation on a novel vacuum microelectronic pressure sensor with stepped field emission array |
|
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 4,
1997,
Page 1573-1576
S. H. Xia,
J. Liu,
D. F. Cui,
J. H. Han,
S. F. Chen,
L. Wang,
Preview
|
PDF (220KB)
|
|
摘要:
This article investigates a novel vacuum microelectronic pressure sensor in which the cathode emission array is distributed over a stepped cathode base instead of over a conventional flat cathode base. Our computer simulation results indicate that using the stepped field emission array gives the potential of increasing the sensor’s sensitivity and expanding its measurement range. Computer simulations are presented, and some experimental results are briefly reported.
ISSN:1071-1023
DOI:10.1116/1.589403
出版商:American Vacuum Society
年代:1997
数据来源: AIP
|
152. |
Robotic nanomanipulation with a scanning probe microscope in a networked computing environment |
|
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 4,
1997,
Page 1577-1580
C. Baur,
B. C. Gazen,
B. Koel,
T. R. Ramachandran,
A. A. G. Requicha,
L. Zini,
Preview
|
PDF (181KB)
|
|
摘要:
This article describes the initial phase of the development of a high-level programming system for robotic manipulation with a scanning probe microscope (SPM). A SPM server has been developed, which runs in theWINDOWSenvironment of the PC that controls the microscope. Client programs running on Unix work stations or other computers connected to the Internet can send remote commands to the SPM through the server. The clients can be sophisticated artificial intelligence programs that reason about robotic tasks and sensory data acquired by the SPM. A first set of intermediate-level commands has also been developed for sensing and manipulation. The system is being tested by pushing colloidal gold nanoparticles with dimensions in the order of 15–30 nm on a mica substrate in noncontact atomic force microscope mode. The test programs image the sample, search for nanoparticles in the presence of thermal drift, turn feedback on and off for pushing, and so on. The particles are being moved reliably.
ISSN:1071-1023
DOI:10.1116/1.589404
出版商:American Vacuum Society
年代:1997
数据来源: AIP
|
153. |
Using a new kind of organic complex system of electrical bistability for ultrahigh density data storage |
|
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 4,
1997,
Page 1581-1583
H. J. Gao,
L. P. Ma,
H. X. Zhang,
H. Y. Chen,
Z. Q. Xue,
S. J. Pang,
Preview
|
PDF (90KB)
|
|
摘要:
We present a new kind of organic complex system of electrical bistability,m-nitrobenzal malononitrile and diamine benzene (mNBMN-DAB), which can be employed as ultrahigh density data storage devices by scanning tunneling microscopy (STM). The mNBMN-DAB thin film was prepared on highly oriented pyrolitic graphite (HOPG) substrates using physical vacuum deposition method. A critical voltage pulse between the STM tip and the surface of the HOPG substrate can make marks on the thin films. The size of the marks is about 1.3 nm and the corresponding data storage density is larger than1013bits/cm2.A new mechanism of the charge transfer in the system for the data storage is suggested. These results show a great potential of this type of organic composite systems in the application of the ultrahigh density data storage.
ISSN:1071-1023
DOI:10.1116/1.589405
出版商:American Vacuum Society
年代:1997
数据来源: AIP
|
154. |
Atomic force microscope-based data storage using replicated media |
|
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 4,
1997,
Page 1584-1587
B. D. Terris,
S. A. Rishton,
H. J. Mamin,
M. E. Best,
J. A. Logan,
D. Rugar,
Preview
|
PDF (514KB)
|
|
摘要:
We have developed a technique for both mastering and replicating data patterns for potential use in an atomic force microscope (AFM)-based data storage device. The process consists of using electron beam lithography to write data features as small as 50 nm and a photopolymerization process to faithfully replicate the written marks. The replicas can be read using a contact-mode AFM tip on a rotating disk, and no change in the signal is seen after 12 days of continuous reading.
ISSN:1071-1023
DOI:10.1116/1.589406
出版商:American Vacuum Society
年代:1997
数据来源: AIP
|
|