Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena


ISSN: 1071-1023        年代:1997
当前卷期:Volume 15  issue 4     [ 查看所有卷期 ]

年代:1997
 
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151. Investigation on a novel vacuum microelectronic pressure sensor with stepped field emission array
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  4,   1997,   Page  1573-1576

S. H. Xia,   J. Liu,   D. F. Cui,   J. H. Han,   S. F. Chen,   L. Wang,  

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152. Robotic nanomanipulation with a scanning probe microscope in a networked computing environment
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  4,   1997,   Page  1577-1580

C. Baur,   B. C. Gazen,   B. Koel,   T. R. Ramachandran,   A. A. G. Requicha,   L. Zini,  

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153. Using a new kind of organic complex system of electrical bistability for ultrahigh density data storage
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  4,   1997,   Page  1581-1583

H. J. Gao,   L. P. Ma,   H. X. Zhang,   H. Y. Chen,   Z. Q. Xue,   S. J. Pang,  

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154. Atomic force microscope-based data storage using replicated media
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  15,   Issue  4,   1997,   Page  1584-1587

B. D. Terris,   S. A. Rishton,   H. J. Mamin,   M. E. Best,   J. A. Logan,   D. Rugar,  

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