Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena


ISSN: 1071-1023        年代:1983
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年代:1983
 
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51. Formation of silicon nitride layers on crystalline silicon by ion implantation as revealed by internal friction and infrared transmission measurements
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  1,   Issue  2,   1983,   Page  398-400

A. S. Ogale,   V. N. Bhoraskar,   S. V. Ghaisas,   V. P. Godbole,   S. B. Ogale,   B. S. Raye,  

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52. Fermi‐level pinning at heterojunctions
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  1,   Issue  2,   1983,   Page  401-403

Roland E. Allen,   Richard P. Beres,   John D. Dow,  

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53. Electronic properties of MO–CVD grown InGaAs–InP heterojunctions and superlattices
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  1,   Issue  2,   1983,   Page  404-408

M. Voos,  

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54. Optical transmission in GaSb–AlSb superlattices
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  1,   Issue  2,   1983,   Page  409-411

P. Voisin,   G. Bastard,   M. Voos,   E. E. Mendez,   C.‐A. Chang,   L. L. Chang,   L. Esaki,  

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55. Plasma oscillations of layered electron gases in semiconductor heterostructures
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  1,   Issue  2,   1983,   Page  412-414

D. Olego,   A. Pinczuk,   A. C. Gossard,   W. Wiegmann,  

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56. A simple model for the index of refraction of GaAs–AlAs superlattices and heterostructure layers: Contributions of the states around Γ
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  1,   Issue  2,   1983,   Page  415-419

J. P. Leburton,   K. Hess,  

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57. Persistent red shift of the photoluminscence from the semi‐insulating GaAs substrate in an AlxGa1−xAs/GaAs modulation‐doped structure
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  1,   Issue  2,   1983,   Page  420-422

Bernhard Fischer,   Douglas M. Collins,  

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58. Observation of the deHaas–van Alphen effect in a two‐dimensional electron system
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  1,   Issue  2,   1983,   Page  423-426

H. L. Störmer,   T. Haavasoja,   V. Narayanamurti,   A. C. Gossard,   W. Wiegmann,  

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59. Collective plasmon modes of a semiconductor superlattice
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  1,   Issue  2,   1983,   Page  431-434

W. L. Bloss,  

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60. Interference effect in multivalley quantum well structures
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  1,   Issue  2,   1983,   Page  435-438

Yia‐Chung Chang,   D. Z.‐Y. Ting,  

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