Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena


ISSN: 1071-1023        年代:1998
当前卷期:Volume 16  issue 2     [ 查看所有卷期 ]

年代:1998
 
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71. Analysis of electron emission degradation in silicon field emitter arrays
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  16,   Issue  2,   1998,   Page  815-817

Yoon-Ho Song,   Jin Ho Lee,   Seung-Youl Kang,   Yong-Il Lee,   Kyoung Ik Cho,   Hyung Joun Yoo,  

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72. Tunneling emission from valence band of Si-metal–oxide–semiconductor electron tunneling cathode
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  16,   Issue  2,   1998,   Page  818-821

Junji Ikeda,   Atsushi Yamada,   Kazuya Okamoto,   Yoshiaki Abe,   Kaoru Tahara,   Hidenori Mimura,   Kuniyoshi Yokoo,  

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73. GaN field emitter array diode with integrated anode
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  16,   Issue  2,   1998,   Page  822-825

Robert D. Underwood,   S. Keller,   U. K. Mishra,   D. Kapolnek,   B. P. Keller,   S. P. DenBaars,  

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74. Characterization of two by two electron-beam microcolumn array aligned with field emission array
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  16,   Issue  2,   1998,   Page  826-828

Jeong-Young Park,   Jared D. Lera,   H. J. Choi,   G. H. Buh,   C. J. Kang,   J. H. Jung,   S. S. Choi,   D. Jeon,   Young Kuk,  

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75. Emission characteristics of ZrN thin film field emitter array fabricated by ion beam assisted deposition technique
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  16,   Issue  2,   1998,   Page  829-832

M. Nagao,   Y. Fujimori,   Y. Gotoh,   H. Tsuji,   J. Ishikawa,  

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76. Fabrication of GaN field emitter arrays by selective area growth technique
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  16,   Issue  2,   1998,   Page  833-835

T. Kozawa,   M. Suzuki,   Y. Taga,   Y. Gotoh,   J. Ishikawa,  

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77. Atomic investigation of individual apexes of diamond emitters by a scanning atom probe
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  16,   Issue  2,   1998,   Page  836-840

Osamu Nishikawa,   Takahiro Sekine,   Yoshikatsu Ohtani,   Kiyoshi Maeda,   Yoshihiro Numada,   Masafumi Watanabe,  

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78. Emission observation of a microtip cathode array with an electrostatic-lens projector: Statistical approach
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  16,   Issue  2,   1998,   Page  841-850

C. Constancias,   R. Baptist,  

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79. Metal–insulator–semiconductor emitter with an epitaxialCaF2layer as the insulator
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  16,   Issue  2,   1998,   Page  851-854

Y. Miyamoto,   A. Yamaguchi,   K. Oshima,   W. Saitoh,   M. Asada,  

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80. Investigation of Ce-doped silicates for low voltage field emission displays
  Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,   Volume  16,   Issue  2,   1998,   Page  855-857

R. Y. Lee,   F. L. Zhang,   J. Penczek,   B. K. Wagner,   P. N. Yocom,   C. J. Summers,  

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