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1. |
Nanoscale etching of GaAs surfaces in electrolytic solutions by hole injection from a scanning tunneling microscope tip |
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Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 5,
1997,
Page 1595-1598
C. Kaneshiro,
T. Okumura,
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摘要:
Controllable etching of GaAs(100) has been electrochemically achieved on a nanometer scale by using a scanning tunneling microscope (STM) in acidic solutions(pH=2–3).The realized features onn-GaAs(100) surface were as small as 10 nm. We studied the dependence of the etching rate on the potentials applied to the STM tip as well as the GaAs substrate. These results indicate that the hole injection from the tip is responsible for the local etching of GaAs surfaces in electrolytes rather than local charges induced by an electric field.
ISSN:1071-1023
DOI:10.1116/1.589553
出版商:American Vacuum Society
年代:1997
数据来源: AIP
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2. |
Effect of etch holes on the mechanical properties of polysilicon |
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Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 5,
1997,
Page 1599-1603
William N. Sharpe,
Ranji Vaidyanathan,
Bin Yuan,
Gang Bao,
Richard L. Edwards,
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摘要:
For large movable parts in the microelectromechanical systems, etch holes are needed to facilitate the releasing process. These etch holes obviously weaken the structure and affect its mechanical properties. New techniques and structures have been developed to measure the mechanical properties of very thin microelectromechanical systems (MEMS) materials. A dog-bone shaped tensile specimen is imposed with a uniaxial stress field and strain is directly measured on the specimen with the interferometric strain/displacement gage. This testing approach has been used to study the effect of etch holes on the mechanical properties of polysilicon thin film. The material is phosphorus doped, low pressure chemical vapor deposited polysilicon deposited at MCNC the multi-user MEMS processes. The specimen is 3.5 μm thick and 0.6 mm wide at its narrowest point. The etch holes are about 5 μm in diameter and 30 μm apart. Compared with the mechanical properties of the specimens without etch holes, the tensile strength has dropped by 50% and the Young’s modulus decreases only about 18% due to the existence of the etch holes. Finite element modeling is applied to the specimens with etch holes and in agreement with the test results.
ISSN:1071-1023
DOI:10.1116/1.589554
出版商:American Vacuum Society
年代:1997
数据来源: AIP
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3. |
Modification of surface morphology and optoelectronic response in porous Si films by electrochemical methods |
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Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 5,
1997,
Page 1604-1606
Zhong-Hua Yang,
Peng Zhang,
De-Jun Wang,
Tie-Jin Li,
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摘要:
The effect of variedH+concentration on surface morphology of porous silicon (PS) is observed by atomic force microscopy technique. A new mechanism of PS formation concerningH+effect is proposed. The photoluminescence (PL) spectra of two typical PS samples have different responses in the short-wavelength region. Surface photovoltage spectra results imply that the short-wavelength PL band of the PS sample prepared in highH+concentration may be related to direct band-gap transition.
ISSN:1071-1023
DOI:10.1116/1.589555
出版商:American Vacuum Society
年代:1997
数据来源: AIP
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4. |
Visible photoluminescence of Ge nanocrystallites embedded inSiO2thin films |
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Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 5,
1997,
Page 1607-1609
Lanping Yue,
Yizhen He,
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摘要:
A strong photoluminescence (PL) with a peak position of ∼420 nm (2.95 eV) under exciting radiation of λ=300 nm, and two new luminescence peaks at ∼420 and 470 nm, under λ=633 nm excitation at room temperature are observed, evidently for Ge nanocrystallites embedded inSiO2thin films(Ge–SiO2)prepared by the ion-beam sputtering technique. The studies reveal that the nanometer-size crystalline Ge have a type of face-centered-cubic structure and characteristics of direct optical transition. It is suggested that the visible PL ofGe–SiO2thin films is not only related to the quantum size effect due to three-dimensional confinement of electrons and holes, but also closely associated with the particular microstructure of the Ge nanocrystallites.
ISSN:1071-1023
DOI:10.1116/1.589556
出版商:American Vacuum Society
年代:1997
数据来源: AIP
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5. |
Structure and phonon density of states in nanoclusters: Molecular dynamics study for Al |
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Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 5,
1997,
Page 1610-1612
W. Schommers,
M. Rieth,
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摘要:
The generalized phonon density of states for Al nanoclusters was studied theoretically using molecular dynamics. By doing this anharmonic effects could be fully considered. In order to investigate the structure of the clusters we have also calculated the structure factorS(q)(Fourier transform of the pair correlation function). The calculations were done for systems consisting of 500 atoms and at several temperatures. Stable and metastable cluster states are observed: The clusters in the metastable state show a well defined peak in the structure factorS(q)which we interpret as superstructure. The appearance of the superstructure in the metastable state is accompanied by substantial change in the phonon density of states.
ISSN:1071-1023
DOI:10.1116/1.589557
出版商:American Vacuum Society
年代:1997
数据来源: AIP
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6. |
Thermal desorption of Si clusters from Si and Si-deposited Ta surfaces |
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Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 5,
1997,
Page 1613-1617
Hideyuki Tanaka,
Toshihiko Kanayama,
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摘要:
We performed quadrupole mass spectrometry (QMS) of Si clusters that thermally desorbed from various surfaces in ultrahigh vacuum. To investigate the effect of substrate on cluster formation, different kinds of substrates were prepared: Si(100) wafers, Si(111) wafers, and Si-deposited Ta polycrystalline sheets. When Si wafers were heated at 900–1300 °C, QMS spectra showed that clusters up toSi6sublimed from the surfaces. Both of (100) and (111) had the same activation energy for desorption of the clusters. On the contrary, QMS spectra from Si-deposited Ta at 1500 °C showed monomeric Si only. These results agree with the thermodynamic consideration that the desorption rate of each cluster is determined by its formation energy. The relation of cluster formation with the surface structure is also discussed.
ISSN:1071-1023
DOI:10.1116/1.589558
出版商:American Vacuum Society
年代:1997
数据来源: AIP
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7. |
Nanoscale organized assembly of nanoparticulateTiO2-stearate monolayers through the Langmuir–Blodgett method |
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Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 5,
1997,
Page 1618-1622
Lin Song Li,
Jie Zhang,
Li Jun Wang,
Yongmei Chen,
Zheng Hui,
Tie Jin Li,
L. F. Chi,
H. Fuchs,
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摘要:
Nanoparticulate titanium dioxide-stearate(TiO2-St)monolayer was directly obtained usingTiO2hydrosol as the subphase. The atomic force microscopy images of monolayer, show that the higher coverage were obtained through deposition on the hydrophilic Si(100) surface rather than the hydrophobic Si(100) surface. From the surface photovoltage spectra ofTiO2-Stmonolayer, it can be followed that the photovoltage response of then-type silicones increased by a factor of 25, and 5 times after a monolayer ofTiO2-StLangmuir–Blodgett (LB) films was transferred onto hydrophobic and hydrophilic Si surface, respectively. On the contrary, the photovoltage response value is reduced by ∼40 and 5 times by the deposition of the LB monolayer in the case of the hydrophobic and hydrophilicp-type Si surface, respectively. It is considered that the enhancement of the photovoltage response may be due to the ordered electrostatic potential orientation of the Si(100)/TiO2-St/ITOheterostructures.
ISSN:1071-1023
DOI:10.1116/1.589559
出版商:American Vacuum Society
年代:1997
数据来源: AIP
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8. |
Tensor low energy electron diffraction study for the structure of aCr(001)-p-(1×1)-Nsurface |
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Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 5,
1997,
Page 1623-1627
Chang-Seop Ri,
Yong-Phil Cho,
Jong-Bo Park,
Jeong-Soo Kang,
Se-Hoon Kim,
Kyung-Hee Lee,
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摘要:
The structure of theCr(001)-p-(1×1)-Nsurface was studied by use of the tensor low energy electron diffraction (LEED) current-voltage(I–V)analysis. From the LEED diffraction pattern observed in the process of cleaning of the Cr(001) surface, N was found to form a(1×1)structure on the Cr(001) surface. ExperimentalI–Vcharacteristic curves for theCr(001)-p-(1×1)-Nstructure were generated by Video LEED System and these experimental results were compared with that obtained through theoretical calculations via the TLEED program to analyze surface structure. As a result, we found that N is adsorbed in the hollow site on the Cr(001) surface. The interlayer distances ofdN1,d12,andd23are found to be 0.251, 1.814, and 1.410 Å, respectively.
ISSN:1071-1023
DOI:10.1116/1.589560
出版商:American Vacuum Society
年代:1997
数据来源: AIP
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9. |
Extraordinary growth ofC60on a GaAs(001) As-rich2×4surface |
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Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 5,
1997,
Page 1628-1632
T. Sakurai,
Qikun Xue,
T. Hashizume,
Y. Hasegawa,
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摘要:
We have systematically investigated, by using scanning tunneling microscopy, the adsorption and film growth ofC60on the various GaAs(001) surface phases prepared by molecular-beam epitaxy. For most phases, theC60overlayer exhibits the usual close-packed fcc(111) configuration with its lattice constant close to that of the bulkC60crystal. However, in the case ofC60on the As-rich2×4substrate, the epitaxial growth is found to be quite different and unique;C60film takes its (110) crystalline axis; theC60overlayer is highly strained with a lattice expansion of∼13%,and this structure is very stable at least up to 10 ML. We will address the underlying formation mechanism of this new structure in terms of a charge transfer from the As-dangling bonds toC60sand a site-specificC60-substrate interaction, as confirmed by molecular dynamic simulations. The present system provides a unique opportunity to study fullerene and/or noble-gas related two-dimensional phenomena, and demonstrates a potential for fabrication of novel fullerene-based devices, such as strained superlattice structures.
ISSN:1071-1023
DOI:10.1116/1.589561
出版商:American Vacuum Society
年代:1997
数据来源: AIP
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10. |
Precise force curves in air and liquid by magnetic force feedback |
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Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Volume 15,
Issue 5,
1997,
Page 1633-1636
Shin-ichi Yamamoto,
Hirofumi Yamada,
Hiroshi Tokumoto,
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摘要:
We developed an atomic force microscopy with the tip position was accurately controlled through the magnetic interaction between a coil and the magnet fixed behind the cantilever. By incorporating a feedback system, we could control the motion of a soft cantilever (0.68 N/m) in air and liquid, and obtain force curves without instabilities originating from the strong attractive and adhesive forces between the tip and the sample.
ISSN:1071-1023
DOI:10.1116/1.589562
出版商:American Vacuum Society
年代:1997
数据来源: AIP
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