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1. |
Proton-Induced X-Ray Emission Analysis |
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C R C Critical Reviews in Analytical Chemistry,
Volume 11,
Issue 3,
1981,
Page 161-193
Md. Rashiduzzaman Khan,
Dennis Crumpton,
Sven Johansson,
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PDF (2040KB)
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摘要:
As discussed previously, the minimum detectable limit (MDL) and the efficiency of PIXE analysis depends on the characteristic X-ray peak to background ratio and the capabilities of the X-ray detecting system. Any discussion of the limitations and possible improvements for PIXE analysis must be based on a full understanding of these factors.
ISSN:0007-8980
DOI:10.1080/10408348108542731
出版商:Taylor & Francis Group
年代:1981
数据来源: Taylor
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2. |
Spectrophotometric Determination of Trace Elements |
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C R C Critical Reviews in Analytical Chemistry,
Volume 11,
Issue 3,
1981,
Page 195-260
Zygmunt Marczenko,
Henry Freiser,
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PDF (3865KB)
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摘要:
The rapid and continuous progress in trace analysis is associated with the development of several new techniques and industries, the beginnings of which date back to the years following World War II. Their demands for high purity materials are the main driving force, although the idea of microelements has been known for a long time in biological, agrotechnical, and geological studies, as well as in forensic analysis. Trace analysis is also an excellent analytical tool in the food industry and in environmental pollution and archeological research. As recognized recently, trace amounts of many metals and nonmetals are essential for normal biological processes. On the other hand, some elements are toxic if present in too high concentrations. With so many fields of interest and application, trace analysis has become now the major problem of the day in analytical chemistry.
ISSN:0007-8980
DOI:10.1080/10408348108542732
出版商:Taylor & Francis Group
年代:1981
数据来源: Taylor
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